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Fabrication and Characterization of Undoped and Cobalt-doped ZnO Based UV Photodetector Prepared by RF-sputtering 被引量:1
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作者 Husam S.Al-Salman m.j.abdullah 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2013年第12期1139-1145,共7页
Undoped and 1 at.% Co-doped ZnO nanostructure based UV photodetectors were successfully fabricated by RF- magnetron sputtering technique with comb like Pt electrodes. Cobalt ions were successfully incorporated into th... Undoped and 1 at.% Co-doped ZnO nanostructure based UV photodetectors were successfully fabricated by RF- magnetron sputtering technique with comb like Pt electrodes. Cobalt ions were successfully incorporated into the lattice of the ZnO nanostructure without changing its wurtzite structure. It was indicated that Co-doping can effectively adjust the luminescence properties of the ZnO nanostructure. The undoped and Co-doped ZnO photodetectors were observed to have photosensitivities of 1.44 x 104 % and 8.57 x 102 % and low dark currents of 9.74 x 10-8 A and 1.18 x 10-7 A, respectively. 展开更多
关键词 CHARACTERIZATION Co-doped ZnO UV photodetector
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Annealing Effects on the Structural, Optical, and UV Photoresponse Properties of ZnO Nanostructures Prepared by RF-Magnetron Sputtering at Different Deposition Temperatures
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作者 Husam S.Al-Salman m.j.abdullah 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2015年第2期230-242,共13页
Undoped ZnO nanostructures were deposited on SiO2/Si substrates via radio 11:equency magnetron sputtenng at different deposition temperatures (room temperature, 200, 300, and 400 ℃). The prepared samples were anne... Undoped ZnO nanostructures were deposited on SiO2/Si substrates via radio 11:equency magnetron sputtenng at different deposition temperatures (room temperature, 200, 300, and 400 ℃). The prepared samples were annealed at 500 ℃ for 2 h under an N2 flow. The structural, surface morphological, optical, and photoresponse characteristics of ZnO nanostructures as deposited and after annealing were then investigated. The energy bandgaps of all samples after annealing (3.22-3.28 eV) decreased compared with those of the as-deposited specimens. The barrier height increased when the deposition temperature increased and reached 0.77 eV at 400 ℃ after annealing with a leakage current of 0.17 gA at a 5 V bias. The UV photodetector device which was deposited at the optimal temperature of 300 ℃, has 12.51 × 10^3% pho- tosensitivity, 2.259 pA dark current, 0.508 s response time, and 0.466 s recovery time. The dark current significantly decreased for all samples after annealing. The proposed UV photodetectors exhibit high performance, high photosensi- tivity, shorter response and recovery times, and excellent stability at lower bias voltages of 5 and 2 V. 展开更多
关键词 Undoped ZnO UV photoresponse Deposition temperatures Annealing effect
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