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试剂选用及带型读取方式对遗传图谱数据SSR的影响 被引量:1
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作者 陈浩东 刘方 +6 位作者 m.k.r.khan 蔡小彦 王为 王春英 王玉红 李育强 王坤波 《湖南农业科学》 2013年第5期11-14,共4页
遗传图谱的构建是基因组研究中的重要环节,是基因定位与克隆、分子标记辅助育种的基础。遗传图谱的可靠性,直接影响到基因定位的结果,进而影响到基因的图位克隆和分子标记辅助选择的效果。在利用SSR分子标记构建棉花种间高密度遗传图谱... 遗传图谱的构建是基因组研究中的重要环节,是基因定位与克隆、分子标记辅助育种的基础。遗传图谱的可靠性,直接影响到基因定位的结果,进而影响到基因的图位克隆和分子标记辅助选择的效果。在利用SSR分子标记构建棉花种间高密度遗传图谱的实验过程中,从开始PCR操作、聚丙烯酰胺凝胶检测,到群体基因型数据读取,每个实验环节都有可能导致遗传图谱数据的失真。探讨了实验过程出现的影响遗传图谱可靠性的几个关键环节及其注意事项。 展开更多
关键词 SSR分子标记 棉花 遗传图谱 可靠性 影响因素
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Effect of Co doping on structural, optical, electrical and thermal properties of nanostructured ZnO thin films 被引量:1
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作者 Sonet Kumar Saha M.Azizar Rahman +2 位作者 M.R.H.Sarkar M.Shahjahan m.k.r.khan 《Journal of Semiconductors》 EI CAS CSCD 2015年第3期35-40,共6页
Nanocrystalline Zn1-x CoxO(where x varies from 0 to 0.04 in steps of 0.01) thin films were deposited onto glass substrate by the spray pyrolysis technique at a substrate temperature of 350 ℃. The X-ray diffraction ... Nanocrystalline Zn1-x CoxO(where x varies from 0 to 0.04 in steps of 0.01) thin films were deposited onto glass substrate by the spray pyrolysis technique at a substrate temperature of 350 ℃. The X-ray diffraction patterns confirm the formation of hexagonal wurtzite structure. The crystal grain size of these films was found to be in the range of 11–36 nm. The scanning electron micrographs show a highly crystalline nanostructure with different morphologies including rope-like morphology for undoped ZnO and nanowalls and semispherical morphology for Co-doped Zn O. The transmittance increases with increasing Co^2+ doping. The optical absorption edge is observed in the transmittance spectra from 530 to 692 nm, which is due to the Co2C absorption bands corresponding to intraionic d–d^* shifts. The direct and indirect optical band gap energies decrease from 3.05 to 2.75 eV and 3.18 to 3.00 eV, respectively for 4 mol% Co doping. The electrical conductivity increases with increasing both the Co doping and temperature, indicating the semiconducting nature of these films. The temperature dependence thermal electromotive force measurement indicates that both undoped and Co-doped ZnO thin films show p-type semiconducting behavior near room temperature. This behavior dies out beyond 313 K and they become n-type semiconductors. 展开更多
关键词 ZnO:Co thin films structural properties optical properties electrical properties thermal properties
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Structural and opto-electrical properties of pyrolized ZnO-CdO crystalline thin films 被引量:1
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作者 A.M.M.Tanveer Karim m.k.r.khan M.Mozibur Rahman 《Journal of Semiconductors》 EI CAS CSCD 2015年第5期1-7,共7页
A series of ZnO-CdO thin films of different molar ratios of Zn and Cd have been deposited on glass sub- strate at substrate temperature -360℃ by the spray pyrolysis technique at an ambient atmosphere. X-ray diffracti... A series of ZnO-CdO thin films of different molar ratios of Zn and Cd have been deposited on glass sub- strate at substrate temperature -360℃ by the spray pyrolysis technique at an ambient atmosphere. X-ray diffraction (XRD) studies confirmed the polycrystalline nature of the film and modulated crystal structures ofwurtzite (ZnO) and cubic (CdO) are formed. The evaluated lattice parameters, and crystallite size are consistent with literature. Dislocation density and strain increased in the film as the grain sizes of ZnO and CdO are decreased. The band gap energy varies from 3.20 to 2.21 eV depending on the Zn/Cd ratios in the film. An incident photon intensity dependent I-V study confirmed that the films are highly photosensitive. Current increased with the increase of the intensity of the light beam. The optical conductivity and the optical constants, such as extinction coefficient, refractive index and complex dielectric constants are evaluated from transmittance and reflectance spectra of the films and these parameters are found to be sensitive to photon energy and displayed intermediate optical properties between ZnO and CdO, making it preferable for applications as the buffer and window layers in solar cells. 展开更多
关键词 ZnO-CdO buffer layers XRD spray pyrolysis
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