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Molybdenum sputtering film characterization for high gradient accelerating structures 被引量:2
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作者 S.Bini B.Spataro +13 位作者 A.Marcelli S.Sarti V.A.Dolgashev S.Tantawi A.D.Yeremian Y.Higashi M.G.Grimaldi L.Romano F.Rufno R.Parodi G.Cibin C.Marrelli m.migliorati C.Caliendo 《Chinese Physics C》 SCIE CAS CSCD 2013年第9期73-79,共7页
Technological advancements are strongly required to fulfill the demands of new accelerator devices with the highest accelerating gradients and operation reliability for the future colliders. To this purpose an extensi... Technological advancements are strongly required to fulfill the demands of new accelerator devices with the highest accelerating gradients and operation reliability for the future colliders. To this purpose an extensive R^zD regarding molybdenum coatings on copper is in progress. In this contribution we describe chemical composition, deposition quality and resistivity properties of different molybdenum coatings obtained via sputtering. The deposited films are thick metallic disorder layers with different resistivity values above and below the molibdenum dioxide reference value. Chemical and electrical properties of these sputtered coatings have been characterized by Rutherford backscattering, XANES and photoemission spectroscopy. We will also consider multiple cells standing wave section coated by a molybdenum layer designed to improve the performance of X-Band accelerating systems. 展开更多
关键词 linear accelerator CAVITIES X-BAND coatings XANES RESISTIVITY
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Time-of-flight methodologies with large-area diamond detectors for ion characterization in laser-driven experiments 被引量:1
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作者 M.Salvadori G.Di Giorgio +14 位作者 M.Cipriani M.Sciscio C.Verona P.L.Andreoli G.Cristofari R.De Angelis M.Pillon N.E.Andreev P.Antici N.G.Borisenko D.Giulietti m.migliorati O.Rosmej S.Zahter F.Consoli 《High Power Laser Science and Engineering》 SCIE CAS CSCD 2022年第1期53-63,共11页
The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of st... The time-of-flight technique coupled with semiconductor detectors is a powerful instrument to provide real-time characterization of ions accelerated because of laser-matter interactions.Nevertheless,the presence of strong electromagnetic pulses(EMPs)generated during the interactions can severely hinder its employment.For this reason,the diagnostic system must be designed to have high EMP shielding.Here we present a new advanced prototype of detector,developed at ENEA-Centro Ricerche Frascati(Italy),with a large-area(15 mm×15 mm)polycrystalline diamond sensor having 150 μm thickness.The tailored detector design and testing ensure high sensitivity and,thanks to the fast temporal response,high-energy resolution of the reconstructed ion spectrum.The detector was offline calibrated and then successfully tested during an experimental campaign carried out at the PHELIX laser facility(E_(L)~100 J,τ_(L)=750 fs,I_(L)(1-2.5)×10^(19)W/cm^(2))at GSI(Germany).The high rejection to EMP fields was demonstrated and suitable calibrated spectra of the accelerated protons were obtained. 展开更多
关键词 diamond detector ion diagnostics laser-matter interaction time of flight
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