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Ohmic Contact Formation for n+4H-SiC Substrate by Selective Heating Method Using Hydrogen Radical Irradiation
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作者 Tetsuji Arai Kazuki Kamimura +8 位作者 Chiaya Yamamoto mai shirakura Keisuke Arimoto Junji Yamanaka Kiyokazu Nakagawa Toshiyuki Takamatsu Masaaki Ogino Masaaki Tachioka Haruo Nakazawa 《Journal of Materials Science and Chemical Engineering》 2017年第1期35-41,共7页
We developed an apparatus for producing high-density hydrogen plasma. We confirmed that the temperatures of transition-metal films increased to above 800?C within 5 s when they were exposed to hydrogen plasma formed u... We developed an apparatus for producing high-density hydrogen plasma. We confirmed that the temperatures of transition-metal films increased to above 800?C within 5 s when they were exposed to hydrogen plasma formed using the apparatus. We applied this phenomenon to the selective heat treatment of W/Ni films deposited on n+4H-SiC wafers and formed nickel silicide electrodes. To utilize this method, we can perform the nickel silicidation process without heating the other areas such as channel regions and improve the reliability. 展开更多
关键词 SELECTIVE Heating Nickel SILICIDE Electrode HYDROGEN Plasma Ohmic Contact SiC
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Surface Roughness of SiGe/Si(110) Formed by Stress-Induced Twins and the Solution to Produce Smooth Surface
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作者 Junji Yamanaka mai shirakura +6 位作者 Chiaya Yamamoto Naoto Utsuyama Kei Sato Takane Yamada Kosuke O. Hara Keisuke Arimoto Kiyokazu Nakagawa 《Journal of Materials Science and Chemical Engineering》 2018年第1期25-31,共7页
Lattice-strained Si thin films grown onto SiGe(110)/Si(110) are attracting because of their potential to realize high-speed transistors. In this study we observe surface morphology of Si/SiGe/Si(110) using scanning el... Lattice-strained Si thin films grown onto SiGe(110)/Si(110) are attracting because of their potential to realize high-speed transistors. In this study we observe surface morphology of Si/SiGe/Si(110) using scanning electron microscopy and we also observe microstructure of the identical position using cross-sectional transmission electron microscopy. These results reveal that crossing of stress-induced twins causes remarkable surface roughness. We propose using vicinal substrate to avoid this phenomenon and our successive experimental results are shown in this paper. 展开更多
关键词 STRAINED Si SiGe(110) Stress-Induced Twin Transmission Electron Microscopy
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Feasibility Study to Evaluate Lattice-Space Changing of a Step-Graded SiGe/Si (110) Using STEM Moiré
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作者 Junji Yamanaka mai shirakura +7 位作者 Chiaya Yamamoto Kei Sato Takane Yamada Kosuke O. Hara Keisuke Arimoto Kiyokazu Nakagawa Akimitsu Ishizuka Kazuo Ishizuka 《Journal of Materials Science and Chemical Engineering》 2018年第7期8-15,共8页
A moiré between crystal lattice planes and scanning electron beam-lines formed in a scanning transmission electron microscope includes the information of the lattice spacing. We apply these phenomena to a composi... A moiré between crystal lattice planes and scanning electron beam-lines formed in a scanning transmission electron microscope includes the information of the lattice spacing. We apply these phenomena to a compositionally graded SiGe thin film deposited onto a Si substrate by molecular beam epitaxy method. The results of the experiments and image analysis show the potential of this technique to analyze a slight change of the lattice spacing according to a compositional change. 展开更多
关键词 STEM Moiré SIGE Scanning Transmission Electron Microscopy
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