X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a con- ventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of sample...X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a con- ventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus beating tremendous potential for future clinical diagnosis. In this work, by changing the accel- erating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer （located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan） versus tube voltage. Ex- perimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.展开更多
基金Project supported by the Major State Basic Research Development Program of China(Grant No.2012CB825800)the Science Fund for Creative Research Groups,China(Grant No.11321503)+1 种基金the National Natural Science Foundation of China(Grant Nos.11179004,10979055,11205189,and 11205157)the Japan–Asia Youth Exchange Program in Science(SAKURA Exchange Program in Science)Administered by the Japan Science and Technology Agency
文摘X-ray Talbot-Lau interferometer has been used most widely to perform x-ray phase-contrast imaging with a con- ventional low-brilliance x-ray source, and it yields high-sensitivity phase and dark-field images of samples producing low absorption contrast, thus beating tremendous potential for future clinical diagnosis. In this work, by changing the accel- erating voltage of the x-ray tube from 35 kV to 45 kV, x-ray phase-contrast imaging of a test sample is performed at each integer value of the accelerating voltage to investigate the characteristic of an x-ray Talbot-Lau interferometer （located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan） versus tube voltage. Ex- perimental results and data analysis show that within a range this x-ray Talbot-Lau interferometer is not sensitive to the accelerating voltage of the tube with a constant fringe visibility of ~ 44%. This x-ray Talbot-Lau interferometer research demonstrates the feasibility of a new dual energy phase-contrast x-ray imaging strategy and the possibility to collect a refraction spectrum.
