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Leakage behavior and distortion of the hysteresis loop in ferroelectric thin films
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作者 郑立荣 林成鲁 +2 位作者 许华平 邹世昌 masanori okuyama 《Science China(Technological Sciences)》 SCIE EI CAS 1997年第2期126-134,共9页
Leakage behavior and distortion of the polarization hysteresis loop in ferroelectric thin films are analyzed by applying a totally depleted asymmetric back-to-back Schottky model, with the Pt/Pb(Zr, Ti)O3/Pt ( Pt/ PZT... Leakage behavior and distortion of the polarization hysteresis loop in ferroelectric thin films are analyzed by applying a totally depleted asymmetric back-to-back Schottky model, with the Pt/Pb(Zr, Ti)O3/Pt ( Pt/ PZT/Pt) sandwich structural thin film capacitor as an example. Some interesting phenomena resulting from the asymmetric interfaces, such as the leakage current level, the flat-band voltage, the disclosure of the hysteresis loop, and the change in the remanent polarization and coercive field, as well as the vertical drift of the polarization hysteresis loop, are discussed in detail. The calculated results are also verified with experiments. 展开更多
关键词 FERROELECTRIC thin film SCHOTTKY BARRIER LEAKAGE HYSTERESIS loop.
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