Surface charge accumulation on the spacers is one of the key issues restraining the development of HVDC GIS/GIL.The precise measurement of surface charge properties provides the basis for further study of the surface ...Surface charge accumulation on the spacers is one of the key issues restraining the development of HVDC GIS/GIL.The precise measurement of surface charge properties provides the basis for further study of the surface charge transport mechanism as well as the charge-induced flashover mechanism under DC voltage.In this study,the authors discuss their perspective on the current status,development needs and potential developing orientation of surface charge characterisation techniques.Different surface potential measurement methods and charge inversion algorithms are reviewed regarding the previous studies and future research needs.Drawbacks and outlooks of surface charge measurement techniques are also discussed with the background of laboratory experiment results and on-site measurements.It is hopefully that this study can serve as a useful guide reference for researchers within the same research field.More importantly,it is authors’hope that this study can inspire some novel ideas for readers into developing of more accurate and scientific interface charge characterisation techniques.展开更多
基金the National Natural Science Foundation of China(Grant No.51677113).
文摘Surface charge accumulation on the spacers is one of the key issues restraining the development of HVDC GIS/GIL.The precise measurement of surface charge properties provides the basis for further study of the surface charge transport mechanism as well as the charge-induced flashover mechanism under DC voltage.In this study,the authors discuss their perspective on the current status,development needs and potential developing orientation of surface charge characterisation techniques.Different surface potential measurement methods and charge inversion algorithms are reviewed regarding the previous studies and future research needs.Drawbacks and outlooks of surface charge measurement techniques are also discussed with the background of laboratory experiment results and on-site measurements.It is hopefully that this study can serve as a useful guide reference for researchers within the same research field.More importantly,it is authors’hope that this study can inspire some novel ideas for readers into developing of more accurate and scientific interface charge characterisation techniques.
