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Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial 被引量:1
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作者 Principia Dardano massimo gagliardi +2 位作者 Ivo Rendina Stefano Cabrini Vito Mocella 《Light(Science & Applications)》 SCIE EI CAS 2012年第1期1-5,共5页
In this work,we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal(PhC)with negative refractive index behavior.In the frequency range in which t... In this work,we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal(PhC)with negative refractive index behavior.In the frequency range in which the effective refractive index neff is equal to 21,the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial.These modes resemble surface plasmon polariton resonances.This finding was confirmed by ellipsometric measurements,demonstrating the isotropy of the PhC resonances.Such negative index PhC materials may be of use in biosensing applications. 展开更多
关键词 diffraction gratings METAMATERIALS photonic crystals
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