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A Review of the Study on the Electromigration and Power Electronics
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作者 md. khalilur rahman Abul Monsur Mohammed Musa +3 位作者 Budrun Neher Kawchar Ahmed Patwary Mohammad Atiqur rahman md. Shariful Islam 《Journal of Electronics Cooling and Thermal Control》 2016年第1期19-31,共13页
Electromigration is a main challenge in the pursuit of power electronics, because physical limit to increase current density in power electronics is electromigration (EM), whereas much higher electrical current and vo... Electromigration is a main challenge in the pursuit of power electronics, because physical limit to increase current density in power electronics is electromigration (EM), whereas much higher electrical current and voltage are required for power electronics packaging. So the effect of EM is an important issue in applications where high current densities are used, such as in microelectronics and related structures (e.g., Power ICs). Since the structure size of integrated circuits (ICs) decreases and the practical significance of this effect increases, the result is EM failure. On the other hand, in the next generation power electronics technology electrical current density is expected to exceed 10<sup>7</sup> A/cm<sup>2</sup> which is another challenge. This review work has been carried out to identify the mechanism of EM damage in power electronics (e.g., pure metallization and solder joints) and also how to control this kind of damage. 展开更多
关键词 Voids and Hillocks INTERCONNECT Solder Joint Thermomigration MTF Reliability of IC
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A Review on Zinc Sulphide Thin Film Fabrication for Various Applications Based on Doping Elements 被引量:1
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作者 md. Anisuzzaman Shakil Sangita Das +3 位作者 md. Ashiqur rahman Umma Salma Akther md. Kamrul Hassan Majumdar md. khalilur rahman 《Materials Sciences and Applications》 2018年第9期751-778,共28页
Zinc Sulfide (ZnS) thin film has attracted increasing attention due to their potential applications in the new generation of nano-electronics and opto-electronics devices. The physical and chemical properties of ZnS h... Zinc Sulfide (ZnS) thin film has attracted increasing attention due to their potential applications in the new generation of nano-electronics and opto-electronics devices. The physical and chemical properties of ZnS have outstanding quality for different applications. Moreover, ZnS doped with various elements are creating a new era for both academic research and industrial applications. So, the optical properties of modified ZnS thin film will help us to find a suitable doping element for convenient deposition which may enhance the conductance and transmitting properties of the film. This review work has been carried out to explore the four-modification elements that constitute Cu, Ni, Co & Fe as descending order of atomic number corresponding to Zn, along with some potential applications considering the recent research work with other doping elements too such as Al, C, Pt etc. For example, FE, FET, Catalytic, Solar cell, Electroluminescence, Fuel cell, different sensors (Chemical sensors, Bio-sensors, Humidity sensors, light sensors, UV light sensors) and nanogenerators use ZnS thin film. 展开更多
关键词 ZNS ZNS Properties DOPING ELEMENTS (Cu Ni Co Fe) SENSORS Generators
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