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Lignocellulosic-Based Activated Carbon Prepared by a Chemical Impregnation Method as Electrode Materials for Double Layer Capacitor
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作者 Dipu Borah Diganta Kumar Bharali michael a. morris 《Advances in Chemical Engineering and Science》 2017年第2期175-190,共16页
Activated carbons (ACs) were prepared from a lignocellulosic-based waste material by a chemical impregnation method using KOH, NaOH or CaCl2 as the activating agent. These ACs were characterized by different technique... Activated carbons (ACs) were prepared from a lignocellulosic-based waste material by a chemical impregnation method using KOH, NaOH or CaCl2 as the activating agent. These ACs were characterized by different techniques such as N2 adsorption, FTIR, XRD and SEM. Electrostatic properties viz. pH and pHpzc of AC suspensions in aqueous media were measured. The concentration of surface oxygenated functional groups of the ACs was estimated following the Boehm titration method. Cyclic voltammetry was conducted in H2SO4 after fabricating two-electrode capacitor cells of the ACs. The correlation of AC surface chemistry and morphology with electrochemical performance (capacitance) of powdered electrodes is analyzed and discussed. 展开更多
关键词 Activated Carbon CHEMICAL IMPREGNATION Characterization CAPACITOR
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Development of a facile block copolymer method for creating hard mask patterns integrated into semiconductor manufacturing 被引量:1
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作者 Tandra Ghoshal Matthew T. Shaw +1 位作者 Justin D. Holmes michael a. morris 《Nano Research》 SCIE EI CAS CSCD 2016年第10期3116-3128,共13页
Our goal is to develop a facile process to create patterns of inorganic oxides and metals on a substrate that can act as hard masks. These materials should have high etch contrast (compared to silicon) and so allow ... Our goal is to develop a facile process to create patterns of inorganic oxides and metals on a substrate that can act as hard masks. These materials should have high etch contrast (compared to silicon) and so allow high-aspect-ratio, high- fidelity pattern transfer whilst being readily integrable in modem semiconductor fabrication (FAB friendly). Here, we show that ultra-small-dimension hard masks can be used to develop large areas of densely packed vertically and horizontally orientated Si nanowire arrays. The inorganic and metal hard masks (Ni, NiO, and ZnO) of different morphologies and dimensions were formed using microphase- separated polystyrene-b-poly(ethylene oxide) (PS-b-PEO) block copolymer (BCP) thin films by varying the BCP molecular weight, annealing temperature, and annealing solvent(s). The self-assembled polymer patterns were solvent-processed, and metal ions were included into chosen domains via a selective inclusion method. Inorganic oxide nanopatterns were subsequently developed using standard techniques. High-resolution transmission electron microscopy studies show that high-aspect-ratio pattern transfer could be affected by standard plasma etch techniques. The masking ability of the different materials was compared in order to create the highest quality uniform and smooth sidewall profiles of the Si nanowire arrays. Notably good performance of the metal mask was seen, and this could impact the use of these materials at small dimensions where conventional methods are severely limited. 展开更多
关键词 block copolymer SELF-ASSEMBLY hard mask SILICON NANOWIRES
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