1
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The Characteristic of Threading Dislocation in Different Structures GaN Films Grown by MOCVD |
min lu, zilan li, zhijian yang, zonghui li, bei zhang, guoyi zhang research center for wide-band semiconductor materials, peking university, beijing 100871 p.r.china
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《光学学报》
EI
CAS
CSCD
北大核心
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2003 |
1
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