In this research, a fast methodology to calculate the exact value of the average dynamic power consumption for CMOS combinational logic circuits is developed. The delay model used is the unit-delay model where all gat...In this research, a fast methodology to calculate the exact value of the average dynamic power consumption for CMOS combinational logic circuits is developed. The delay model used is the unit-delay model where all gates have the same propagation delay. The main advantages of this method over other techniques are its accuracy, as it is deterministic and it requires less computational effort compared to exhaustive simulation approaches. The methodology uses the Logic Pictures concept for obtaining the nodes’ toggle rates. The proposed method is applied to well-known circuits and the results are compared to exhaustive simulation and Monte Carlosimulation methods.展开更多
This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for tes...This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set;this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.展开更多
文摘In this research, a fast methodology to calculate the exact value of the average dynamic power consumption for CMOS combinational logic circuits is developed. The delay model used is the unit-delay model where all gates have the same propagation delay. The main advantages of this method over other techniques are its accuracy, as it is deterministic and it requires less computational effort compared to exhaustive simulation approaches. The methodology uses the Logic Pictures concept for obtaining the nodes’ toggle rates. The proposed method is applied to well-known circuits and the results are compared to exhaustive simulation and Monte Carlosimulation methods.
文摘This paper investigates the issue of testing Current Mode Logic (CML) gates. A three-bit parity checker is used as a case study. It is first shown that, as expected, the stuck-at fault model is not appropriate for testing CML gates. It is then proved that switching the order in which inputs are applied to a gate will affect the minimum test set;this is not the case in conventional voltage mode gates. Both the circuit output and its inverse have to be monitored to reduce the size of the test set.
