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Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification 被引量:2
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作者 Nathan J.Szymanski Christopher J.Bartel +3 位作者 Yan Zeng mouhamad diallo Haegyeom Kim Gerbrand Ceder 《npj Computational Materials》 SCIE EI CSCD 2023年第1期2036-2043,共8页
Machine learning(ML)has become a valuable tool to assist and improve materials characterization,enabling automated interpretation of experimental results with techniques such as X-ray diffraction(XRD)and electron micr... Machine learning(ML)has become a valuable tool to assist and improve materials characterization,enabling automated interpretation of experimental results with techniques such as X-ray diffraction(XRD)and electron microscopy.Because ML models are fast once trained,there is a key opportunity to bring interpretation in-line with experiments and make on-the-fly decisions to achieve optimal measurement effectiveness,which creates broad opportunities for rapid learning and information extraction from experiments.Here,we demonstrate such a capability with the development of autonomous and adaptive XRD.By coupling an ML algorithm with a physical diffractometer,this method integrates diffraction and analysis such that early experimental information is leveraged to steer measurements toward features that improve the confidence of a model trained to identify crystalline phases.We validate the effectiveness of an adaptive approach by showing that ML-driven XRD can accurately detect trace amounts of materials in multi-phase mixtures with short measurement times.The improved speed of phase detection also enables in situ identification of short-lived intermediate phases formed during solid-state reactions using a standard in-house diffractometer.Our findings showcase the advantages of in-line ML for materials characterization and point to the possibility of more general approaches for adaptive experimentation. 展开更多
关键词 phase DIFFRACTION AUTONOMOUS
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