期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps 被引量:2
1
作者 A.Hezabra n.a.abdeslam +1 位作者 N.Sengouga M.C.E.Yagoub 《Journal of Semiconductors》 EI CAS CSCD 2019年第2期43-48,共6页
In this work, the effects of GaN channel traps and temperature on the performance of AlGaN/AlN/GaN/AlGaN high electron mobility transistors(HEMTs) on Si(111) substrate, were investigated. 2 D simulations carried out u... In this work, the effects of GaN channel traps and temperature on the performance of AlGaN/AlN/GaN/AlGaN high electron mobility transistors(HEMTs) on Si(111) substrate, were investigated. 2 D simulations carried out using the Silvaco TCAD simulator tool for different drain and gate voltages showed that acceptor-like traps in the channel have a significant influence on the DC and RF characteristics. It was found that deeper acceptors below the conduction band with larger concentration have a more pronounced effect on the transistor performance. Meanwhile, the donor-like traps show no influence. Pulsing the device with different pulse widths and bias conditions, as well as increasing temperature, showed that the traps are more ionized when the pulse is wider or the temperature is higher, which can degrade the drain current and thus the DC characteristics of the transistor. Passivation of the transistor has also a beneficial effect on performance. 展开更多
关键词 ALGAN HEMT ALGAN/ALN/GAN structure silicon SUBSTRATE Silvaco TRAPPING effects channel TRAPS
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部