2D study of AlGaN/AlN/GaN/AlGaN HEMTs' response to traps

In this work, the effects of GaN channel traps and temperature on the performance of AlGaN/AlN/GaN/AlGaN high electron mobility transistors(HEMTs) on Si(111) substrate, were investigated. 2 D simulations carried out using the Silvaco TCAD simulator tool for different drain and gate voltages showed that acceptor-like traps in the channel have a significant influence on the DC and RF characteristics. It was found that deeper acceptors below the conduction band with larger concentration have a more pronounced effect on the transistor performance. Meanwhile, the donor-like traps show no influence. Pulsing the device with different pulse widths and bias conditions, as well as increasing temperature, showed that the traps are more ionized when the pulse is wider or the temperature is higher, which can degrade the drain current and thus the DC characteristics of the transistor. Passivation of the transistor has also a beneficial effect on performance.

Computer modelling and analysis of the photodegradation effect in a-Si:H p–i–n solar cell

Using a previous model, which was developed to describe the light-induced creation of the defect density in the a-Si：H gap states, we present in this work a numerical modelling of the photodegradation effect in the a-Si：H p–i–n solar cell under continuous illumination. We first considered the simple case of a monochromatic light beam with a wavelength λ between 530–540 nm non uniformly absorbed, then the global standard solar spectrum（AM1.5） illumination is taken into account. The photodegradation is analysed on the basis of the resulting changes in the free carrier＇s densities, recombination rate, band structure, electrical potential and field, space charge, and current densities. Changes in the cell＇s external parameters： the open circuit voltage Voc, the short circuit current density Jsc, the fill factor FF and the maximum power density Pmaxare also presented.

S-band low noise amplifier using 1μm InGaAs/InAlAs/InP pHEMT

This paper discusses the design of a wideband low noise amplifier（LNA） in which specific architecture decisions were made in consideration of system-on-chip implementation for radio-astronomy applications.The LNA design is based on a novel ultra-low noise InGaAs/InAlAs/InP pHEMT.Linear and non-linear modelling of this pHEMT has been used to design an LNA operating from 2 to 4 GHz.A common-drain in cascade with a common source inductive degeneration,broadband LNA topology is proposed for wideband applications.The proposed configuration achieved a maximum gain of 27 dB and a noise figure of 0.3 dB with a good input and output return loss（S11〈—10 dB,S22〈—11 dB）.This LNA exhibits an input 1-dB compression point of-18 dBm,a third order input intercept point of 0 dBm and consumes 85 mW of power from a 1.8 V supply.

Numerical simulation of the effect of the free carrier motilities on light-soaked a-Si:H p–i–n solar cell

Using a previous model, which was developed to describe the light-induced creation ofthe defect density in the a-Si：H gap states, we present in this work a computer simulation of the a-Si：H p-i-n solar cell behavior under continuous illumination. We have considered the simple case of a monochromatic light beam nonuniformly absorbed. As a consequence of this light-absorption profile, the increase of the dangling bond density is assumed to be inhomogeneous over the intrinsic layer （i-layer）. We investigate the internal variable profiles during illumination to understand in more detail the changes resulting from the light-induced degradation effect. Changes in the cell external parameters including the open circuit voltage, Voc, the short circuit current density, Jsc, the fill factor, FF, and the maximum power density, Pmax, are also presented. This shows, in addition, the free carrier mobility influence. The obtained results show that Voc seems to be the less affected parameter by the light-induced increase of the dangling bond density. Moreover, its degradation is very weak-sensitive to the free carrier mobility. Finally, the free hole mobility effect is found to be more important than that of electrons in the improvement of the solar cell performance.

Numerical simulation of the effect of gold doping on the resistance to neutron irradiation of silicon diodes

We have carried out a numerical simulation of the effect of gold doping on the electrical characteristics of long silicon diodes exposed to neutron irradiation. The aim is to investigate the effect of gold on the hardness of the irradiated diodes. The reverse current voltage and capacitance voltage characteristics of doped and undoped diodes are calculated for different irradiation doses. The leakage current and the effective doping density are extracted from these two characteristics respectively. The hardness of the diodes is evaluated from the evolution of the leakage current and the effective doping density with irradiation doses. It was found that diodes doped with gold are less sensitive to irradiation than undoped ones. Thus gold appears to stabilise the electrical properties on irradiation. The conduction mechanism is studied by the evolution of the current with temperature. The evaluated activation energy indicates that as the gold doping or irradiation dose increases, the current switches from the basic diffusion to the generation-recombination process, and that it can even become ohmic for very high gold densities or irradiation doses.