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Epitaxial Growth of 4H-SiC on 4° Off-Axis Substrate for Power Devices 被引量:1
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作者 LI Zhe-Yang HAN Ping +3 位作者 LI Yun ni wei-jiang BAO Hui-Qiang LI Yu-Zhu 《Chinese Physics Letters》 SCIE CAS CSCD 2011年第9期257-259,共3页
Homo-epitaxial layers are successfully grown on Si-face 4°off−axis 4H-SiC substrates using the horizontal hot-wall chemical vapor deposition system.The smooth surface without morphological defects is obtained by ... Homo-epitaxial layers are successfully grown on Si-face 4°off−axis 4H-SiC substrates using the horizontal hot-wall chemical vapor deposition system.The smooth surface without morphological defects is obtained by the optimized in situ etching process and growth temperature.Schottky diodes fabricated on the epilayer present a typical I–V characteristic.This is the first report of Schottky diodes fabricated on 4°off-axis 4H-SiC substrates made in China. 展开更多
关键词 TEMPERATURE SCHOTTKY DIODES
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