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共晶焊后热敏电阻的应力分析及优化
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作者 李长安 牛玉秀 +1 位作者 全本庆 关卫林 《电子与封装》 2023年第9期1-4,共4页
为了研究与解决热敏电阻在共晶焊后阻值变大的问题,采用扫描电子显微镜(SEM)观测失效的热敏电阻,发现其内部有裂纹。采用有限元分析法分析热敏电阻经过共晶焊后产生的应力,结果表明,最大应力的位置与裂纹位置基本一致,最大应力的方向与... 为了研究与解决热敏电阻在共晶焊后阻值变大的问题,采用扫描电子显微镜(SEM)观测失效的热敏电阻,发现其内部有裂纹。采用有限元分析法分析热敏电阻经过共晶焊后产生的应力,结果表明,最大应力的位置与裂纹位置基本一致,最大应力的方向与裂纹方向正交,这说明裂纹是由应力引起的。分析了热敏电阻上最大应力与焊料厚度的关系,结果表明,焊料越厚,则热敏电阻在共晶焊时产生的应力越小。通过验证试验可知,采用适当加厚的焊料对热敏电阻进行共晶焊,共晶焊后热敏电阻的外观良好,没有裂纹发生,且阻值没有增大。因此,可采用加厚焊料的方法防止热敏电阻开裂。 展开更多
关键词 热敏电阻 共晶焊 应力 有限元分析法
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Thermal radiation effect in near infrared single photon detector
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作者 LI Bin niu yuxiu FENG Yinde 《Optoelectronics Letters》 EI 2023年第8期468-471,共4页
Aminiaturized near infrared single photon detector is demonstrated by integrating a thermoelectric cooler(TEC),a thermistor,and a planar type In Ga As/In P separate absorption,charge and multiplication structure singl... Aminiaturized near infrared single photon detector is demonstrated by integrating a thermoelectric cooler(TEC),a thermistor,and a planar type In Ga As/In P separate absorption,charge and multiplication structure single photon avalanche diode into a butterfly case.The performance of the device at different temperatures is tested.It can achieve 20.3% single photon detection efficiency and 1.38 k Hz dark count rate when the chip is cooled to 223 K.The test results show that even when the chip temperature is kept constant,the dark count rate of the device still increases with the increase of ambient temperature,which is consistent with the carrier generation mechanism of semiconductor materials.The mechanism is researched and it is found that thermal radiation of the high temperature case is the main source of dark count.The deep research on the mechanism is beneficial to developing higher performance devices in the future. 展开更多
关键词 PHOTON MECHANISM EFFECT
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Ultra-low dark count InGaAs/InP single photon avalanche diode 被引量:2
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作者 LI Bin niu yuxiu +1 位作者 FENG Yinde CHEN Xiaomei 《Optoelectronics Letters》 EI 2022年第11期647-650,共4页
A low noise InGaAs/InP single photon avalanche diode(SPAD) is demonstrated. The device is based on planar type separate absorption, grading, charge and multiplication structure. Relying on reasonably designed device s... A low noise InGaAs/InP single photon avalanche diode(SPAD) is demonstrated. The device is based on planar type separate absorption, grading, charge and multiplication structure. Relying on reasonably designed device structure and low-damage Zn diffusion technology, excellent low-noise performance is achieved. Due to its importance, the physical mechanism of dark count is analyzed through performance characterization at different temperatures. The device can achieve 20% single photon detection efficiency and 320 Hz dark count rate(DCR) with a low after pulsing probability of 0.57% at 233 K. 展开更多
关键词 INGAAS/INP DIODE AVALANCHE
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