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Splitting Behaviour of Implanted MeV Au^(+)Ions in LiB_(3)O_(5)
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作者 WANG Ke-ming SHI Bo-rong +5 位作者 nelson cue LU Fei WANG Feng-xiang XIE Zhao-xia SHEN Ding-yu LIU Yao-gang 《Chinese Physics Letters》 SCIE CAS CSCD 2000年第1期40-42,共3页
The diffusion behaviour of 1.0 and 2.0MeV Au^(+)implanted into LiB_(3)O_(5)single crystal has been studied by the Rutherford backscattering of 2.1 MeV He ions.Annealing was performed at temperatures of 600,700,and 800... The diffusion behaviour of 1.0 and 2.0MeV Au^(+)implanted into LiB_(3)O_(5)single crystal has been studied by the Rutherford backscattering of 2.1 MeV He ions.Annealing was performed at temperatures of 600,700,and 800℃each for 30 min.The results show that the diffusion behaviour is quite different in two cases.In LiB_(3)O_(5),the depth distribution of the 1.0MeV Au is nearly Gaussian and becomes bimodal after annealing at 800℃for 30 min.But in the case of 2.0 MeV,the depth distribution of as implanted Au^(+)in LiB_(3)O_(5)has splitting behaviour.After 800℃for 30 min annealing,there is no obvious diffusion observed.The precise interpretation is needed. 展开更多
关键词 diffusion ANNEALING BEHAVIOUR
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