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Electrodeposition of Gold to Conformally Fill High-Aspect-Ratio Nanometric Silicon Grating Trenches: A Comparison of Pulsed and Direct Current Protocols 被引量:2
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作者 Sami Znati nicholas chedid +3 位作者 Houxun Miao Lei Chen Eric E. Bennett Han Wen 《Journal of Surface Engineered Materials and Advanced Technology》 2015年第4期207-213,共7页
Filling high-aspect-ratio trenches with gold is a frequent requirement in the fabrication of X-ray optics as well as micro-electronic components and other fabrication processes. Conformal electrodeposition of gold in ... Filling high-aspect-ratio trenches with gold is a frequent requirement in the fabrication of X-ray optics as well as micro-electronic components and other fabrication processes. Conformal electrodeposition of gold in sub-micron-width silicon trenches with an aspect ratio greater than 35 over a grating area of several square centimeters is challenging and has not been described in the literature previously. A comparison of pulsed plating and constant current plating led to a gold electroplating protocol that reliably filled trenches for such structures. 展开更多
关键词 PULSED ELECTROPLATING Gold ELECTROPLATING High Aspect Ratio TRENCHES Gold Electrodepostion Di-rect Current Electrodeposition PULSED vs. Direct Current ELECTROPLATING Atomic LAYER Deposition Platinum Seed LAYER Silicon TRENCH Gratings TRENCH FILLING Grating FILLING ALD Adhesive LAYER
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