The desirable characteristics of Ba_(6-3x)Nd_(8+2x)Ti_(18)O_(54)include high dielectric constant,low loss tangent,and high quality factor developed a new field for electronic applications.The microwave dielectric prop...The desirable characteristics of Ba_(6-3x)Nd_(8+2x)Ti_(18)O_(54)include high dielectric constant,low loss tangent,and high quality factor developed a new field for electronic applications.The microwave dielectric properties of Ba_(6-3x)Nd_(8+2x)Ti_(18)O_(54),with x?0:15 ceramics at different sintering temperatures(600–1300C)were investigated.The phenomenon of polarization produced by the applied electric field was studied.The dielectric properties with respect to frequency from 1MHz to 1.5 GHz were measured using Impedance Analyzer,and the results were compared and analyzed.The highest dielectric permittivity and lowest loss factor were defined among the samples.The complex dielectric modulus was evaluated from the measured parameters of dielectric measurement in the same frequency range,and used to differentiate the contribution of grain and grain boundary.展开更多
基金This research was financially supported from the Research University Grant Scheme(RUGS)Project No.:05-02-12-2180RUUniversiti Putra Malaysia(UPM).The authors also acknowledged the Department of Physics,Faculty of Science,UPM and Institute of Advanced Technology(ITMA),UPM.
文摘The desirable characteristics of Ba_(6-3x)Nd_(8+2x)Ti_(18)O_(54)include high dielectric constant,low loss tangent,and high quality factor developed a new field for electronic applications.The microwave dielectric properties of Ba_(6-3x)Nd_(8+2x)Ti_(18)O_(54),with x?0:15 ceramics at different sintering temperatures(600–1300C)were investigated.The phenomenon of polarization produced by the applied electric field was studied.The dielectric properties with respect to frequency from 1MHz to 1.5 GHz were measured using Impedance Analyzer,and the results were compared and analyzed.The highest dielectric permittivity and lowest loss factor were defined among the samples.The complex dielectric modulus was evaluated from the measured parameters of dielectric measurement in the same frequency range,and used to differentiate the contribution of grain and grain boundary.
