At present, an investigation of the lunar ground at great depths is of paramount importance. This investigation can be carried out using decameter and meter waves. This article aims to analyze the variations of the re...At present, an investigation of the lunar ground at great depths is of paramount importance. This investigation can be carried out using decameter and meter waves. This article aims to analyze the variations of the reflectioncoefficient?at?decametric,?meter and decimeteric bands.?A?possibility of determination?of lunar ground characteristics by bistatic radar using powerful ground-based transmitters?at VHF and UHF bands and a receiver aboard a?Moon’s satellite?is analysed. Appropriate algorithms are considered for determinationof the regolith layer thickness,?dielectric permittivity, loss tangent, and density of the regolith and bedrocks. Expected results of measurements have been presented for a two-layer model of lunar ground, consisting of an upper layer with the loose porous rocks (regolith), and the rocks situated more deeply. Revealed regularities are a basis for determining the distribution of the permittivity in subsurface layer.展开更多
文摘At present, an investigation of the lunar ground at great depths is of paramount importance. This investigation can be carried out using decameter and meter waves. This article aims to analyze the variations of the reflectioncoefficient?at?decametric,?meter and decimeteric bands.?A?possibility of determination?of lunar ground characteristics by bistatic radar using powerful ground-based transmitters?at VHF and UHF bands and a receiver aboard a?Moon’s satellite?is analysed. Appropriate algorithms are considered for determinationof the regolith layer thickness,?dielectric permittivity, loss tangent, and density of the regolith and bedrocks. Expected results of measurements have been presented for a two-layer model of lunar ground, consisting of an upper layer with the loose porous rocks (regolith), and the rocks situated more deeply. Revealed regularities are a basis for determining the distribution of the permittivity in subsurface layer.
