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复杂局域结构的STEM非相干成像测定
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作者 阿部 英司 +2 位作者 pennycook S J 《现代科学仪器》 2006年第z1期56-57,共2页
  Nano-or atomic-scale microstructural control has become a key technique to develop superior functional materials,and the success of such project largely relies upon a precise characterization of local atomic/elect...   Nano-or atomic-scale microstructural control has become a key technique to develop superior functional materials,and the success of such project largely relies upon a precise characterization of local atomic/electronic structures.Understanding atomistic origins of nanomaterial's properties will lead to establishing structureproperty relationships,which have been one of the major challenging issues in materials science.…… 展开更多
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