Tan spot(TS) and Septoria nodorum blotch(SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in g...Tan spot(TS) and Septoria nodorum blotch(SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain yield. In this study, two recombinant inbred line populations, ‘Bartai’ × ‘Ciano T79’(referred to as B × C) and ‘Cascabel’ × ‘Ciano T79’(C × C) were tested for TS and SNB response in order to determine the genetic basis of seedling resistance. Genotyping was performed with the DAr Tseq genotypingby-sequencing(GBS) platform. A chromosome region on 5 AL conferred resistance to TS and SNB in both populations, but the effects were larger in B × C(R^2= 11.2%–16.8%) than in C × C(R^2= 2.5%–9.7%). Additionally, the chromosome region on 5BL(presumably Tsn1)was significant for both TS and SNB in B × C but not in C × C. Quantitative trait loci(QTL)with minor effects were identified on chromosomes 1B, 2A, 2B, 3A, 3B, 4D, 5A, 5B, 5D, 6B,and 6D. The two CIMMYT breeding lines ‘Bartai’ and ‘Cascabel’ contributed resistance alleles at both 5AL and 5BL QTL mentioned above. The QTL on 5AL showed linkage with the Vrn-A1 locus, whereas the vrn-A1 allele conferring lateness was associated with resistance to TS and SNB.展开更多
基金supported by the Bill and Melinda Gates Foundation and the United States Agency for International Development (USAID) through the Cereal Systems Initiative for South Asia (CSISA), Durable Rust Resistance in Wheat (DRRW)/Delivering Genetic Gains in Wheat (DGGW) and the CGIAR Research Program for Wheat (CRP WHEAT) projectthe financial support of The National Key Research and Development Program of China on Molecular Design Breeding in Wheat (2016YFD0101802)
文摘Tan spot(TS) and Septoria nodorum blotch(SNB), caused by Pyrenophora tritici-repentis and Parastagonospora nodorum, respectively, are important fungal leaf-spotting diseases of wheat that cause significant losses in grain yield. In this study, two recombinant inbred line populations, ‘Bartai’ × ‘Ciano T79’(referred to as B × C) and ‘Cascabel’ × ‘Ciano T79’(C × C) were tested for TS and SNB response in order to determine the genetic basis of seedling resistance. Genotyping was performed with the DAr Tseq genotypingby-sequencing(GBS) platform. A chromosome region on 5 AL conferred resistance to TS and SNB in both populations, but the effects were larger in B × C(R^2= 11.2%–16.8%) than in C × C(R^2= 2.5%–9.7%). Additionally, the chromosome region on 5BL(presumably Tsn1)was significant for both TS and SNB in B × C but not in C × C. Quantitative trait loci(QTL)with minor effects were identified on chromosomes 1B, 2A, 2B, 3A, 3B, 4D, 5A, 5B, 5D, 6B,and 6D. The two CIMMYT breeding lines ‘Bartai’ and ‘Cascabel’ contributed resistance alleles at both 5AL and 5BL QTL mentioned above. The QTL on 5AL showed linkage with the Vrn-A1 locus, whereas the vrn-A1 allele conferring lateness was associated with resistance to TS and SNB.
