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Tuning Surface Spin Polarization of CoFeB by Boron Diffusion Detected by Spin Resolved Photoemission
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作者 Qi Liu Xianyang Lu +15 位作者 Chengrui Fu Jiarui Chen Zhe Zhang Yuting Gong Xinyue Wang Yu Yan qinwu gao Hui Li Xuezhong Ruan Yao Li Jun Du Jing Wu Liang He Bo Liu Rong Zhang Yongbing Xu 《Chinese Physics Letters》 SCIE EI CAS CSCD 2023年第8期86-91,共6页
Research of spin polarization of magnetic CoFeB thin films is of practical importance in spintronic applications.Here,using a direct characterization technique of spin-resolved photoemission spectroscopy,we obtain the... Research of spin polarization of magnetic CoFeB thin films is of practical importance in spintronic applications.Here,using a direct characterization technique of spin-resolved photoemission spectroscopy,we obtain the surface spin polarization of amorphous Co_(40)Fe_(40)B_(20)thin films with different annealing temperatures from 100℃to 500℃prepared by magnetron sputtering.After high annealing temperature,a quasi-semiconductor state is gradually formed at the CoFeB surface due to the boron diffusion.While the global magnetization remains almost constant,the secondary electrons’spin polarization,average valence band spin polarization and the spin polarization at Fermi level from spin-resolved photoemission spectroscopy show a general trend of decreasing with the increasing annealing temperature above 100℃.These distinct surface properties are attributed to the enhanced Fe-B bonding due to the boron segregation upon surface after annealing as confirmed by x-ray photoelectron spectroscopy and scanning transmission electron microscopy with energy dispersive spectroscopy.Our findings provide insight into the surface spin-resolved electronic structure of the CoFeB thin films,which should be important for development of high-performance magnetic random-access memories. 展开更多
关键词 SPECTROSCOPY ANNEALING BORON
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Site Preference of Se and Te in Bi2Se3-xTex Thin Films
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作者 孙逸哲 Moorthi Kanagaraj +6 位作者 高钦武 赵亚飞 宁纪爱 张昆鹏 陆显扬 何亮 徐永兵 《Chinese Physics Letters》 SCIE CAS CSCD 2020年第7期111-114,共4页
The ternary topological insulators Bi2Se3-xTex have attracted a great deal of attention due to their exotic physical and chemical properties.While most of the studies focus on the properties of these ternary TIs,limit... The ternary topological insulators Bi2Se3-xTex have attracted a great deal of attention due to their exotic physical and chemical properties.While most of the studies focus on the properties of these ternary TIs,limited research was performed to investigate the dynamic atomic stack of its crystal structure.We prepared highquality Bi2Se3-xTex thin films on Ga As(111)B substrates using molecular beam epitaxy,characterized with Raman spectroscopy,x-ray diffraction and photoelectron spectroscopy.It is found that when Se is replaced by Te,the preferred substituting sites are the middle layer at 0<x<1,and this is also valid for Se substituting Te at 2<x<3.In the middle region,the substituting atoms prefer to go to the first and the fifth layer. 展开更多
关键词 spectroscopy. properties. structure.
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