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Analytical modeling of drain current and RF performance for double-gate fully depleted nanoscale SOI MOSFETs 被引量:1
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作者 rajiv sharma Sujata Pandey Shail Bala Jain 《Journal of Semiconductors》 EI CAS CSCD 2012年第2期28-35,共8页
A new 2D analytical drain current model is presented for symmetric double-gate fully depleted nanoscale SOI MOSFETs.Investigation of device parameters like transconductance for double-gate fully depleted nanoscale SOI... A new 2D analytical drain current model is presented for symmetric double-gate fully depleted nanoscale SOI MOSFETs.Investigation of device parameters like transconductance for double-gate fully depleted nanoscale SOI MOSFETs is also carried out.Finally this work is concluded by modeling the cut-off frequency, which is one of the main figures of merit for analog/RF performance for double-gate fully depleted nanoscale SOI MOSFETs.The results of the modeling are compared with those obtained by a 2D ATLAS device simulator to verify the accuracy of the proposed model. 展开更多
关键词 DOUBLE-GATE fully depleted SILICON-ON-INSULATOR Poisson's equation radio frequency ATLAS
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