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Semipolar(1122) and polar(0001) InGaN grown on sapphire substrate by using pulsed metal organic chemical vapor deposition
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作者 Sheng-Rui Xu Ying Zhao +4 位作者 ren-yuan jiang Teng jiang Ze-Yang Ren Jin-Cheng Zhang Yue Hao 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第2期467-472,共6页
High indium semipolar(1122) and polar(0001) In Ga N layers each with a thickness of about 100 nm are realized simultaneously on sapphire substrates by pulsed metal organic chemical vapor deposition(MOCVD). The m... High indium semipolar(1122) and polar(0001) In Ga N layers each with a thickness of about 100 nm are realized simultaneously on sapphire substrates by pulsed metal organic chemical vapor deposition(MOCVD). The morphology evolution, structural and optical characteristics are also studied. The indium content in the layer of the surface(1122)is larger than that of the surface(0001), which is confirmed by reciprocal space map, photoluminescence spectrum and secondary ion mass spectrometer. Additionally, the(0001) surface with island-like morphology shows inhomogeneous indium incorporation, while the(1122) surface with a spiral-like morphology shows a better homogeneous In composition.This feature is also demonstrated by the monochromatic cathodoluminescence map. 展开更多
关键词 semipolar GaN MOCVD
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