The Calculation of area and volume of B-rep solid is discussed, and a numerical method is presented. The method is based on the integrand simplification of the double integral by quadratic triangular Bezier interpolat...The Calculation of area and volume of B-rep solid is discussed, and a numerical method is presented. The method is based on the integrand simplification of the double integral by quadratic triangular Bezier interpolation.展开更多
A surface interpolation algorithm is presented. By using a special kind of knot vector. a B-spline surface can be constructed to interpolate an array of m ×n positions, including parameter u and v tangent vectors...A surface interpolation algorithm is presented. By using a special kind of knot vector. a B-spline surface can be constructed to interpolate an array of m ×n positions, including parameter u and v tangent vectors and twist vector at each positions. Single surface interpolation approach is easier to ensure the smoothness of the interpolating surface than multi-patches method. This algorithm can be used to solve the approximating problem of B-spline approximation of general parametric surface.展开更多
The conventional test-per-scan built-in self-test （BIST） scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next t...The conventional test-per-scan built-in self-test （BIST） scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next test vector like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly controlling the test signals of the scan chains. Different biased random values are assigned to the test signals of scan flip-flops in separate scan chains. Capture cycles can be inserted at any clock cycle if necessary. A new testability estimation procedure according to the proposed testing scheme is presented. A greedy procedure is proposed to select a weight for each scan chain. Experimental results show that the proposed method can improve test effectiveness of scan-based BIST greatly, and most circuits can obtain complete fault coverage or very close to complete fault coverage.展开更多
文摘The Calculation of area and volume of B-rep solid is discussed, and a numerical method is presented. The method is based on the integrand simplification of the double integral by quadratic triangular Bezier interpolation.
文摘A surface interpolation algorithm is presented. By using a special kind of knot vector. a B-spline surface can be constructed to interpolate an array of m ×n positions, including parameter u and v tangent vectors and twist vector at each positions. Single surface interpolation approach is easier to ensure the smoothness of the interpolating surface than multi-patches method. This algorithm can be used to solve the approximating problem of B-spline approximation of general parametric surface.
基金the National Natural Science Foundation of China (Grant Nos.60373009 and 60425203)
文摘The conventional test-per-scan built-in self-test （BIST） scheme needs a number of shift cycles followed by one capture cycle. Fault effects received by the scan flipflops are shifted out while shifting in the next test vector like scan testing. Unlike deterministic testing, it is unnecessary to apply a complete test vector to the scan chains. A new scan-based BIST scheme is proposed by properly controlling the test signals of the scan chains. Different biased random values are assigned to the test signals of scan flip-flops in separate scan chains. Capture cycles can be inserted at any clock cycle if necessary. A new testability estimation procedure according to the proposed testing scheme is presented. A greedy procedure is proposed to select a weight for each scan chain. Experimental results show that the proposed method can improve test effectiveness of scan-based BIST greatly, and most circuits can obtain complete fault coverage or very close to complete fault coverage.
