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Deep Multiview Image Fusion for Soybean Yield Estimation in Breeding Applications 被引量:4
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作者 Luis GRiera Matthew ECarroll +8 位作者 Zhisheng Zhang Johnathon MShook sambuddha ghosal Tianshuang Gao Arti Singh Sourabh Bhattacharya Baskar Ganapathysubramanian Asheesh K.Singh Soumik Sarkar 《Plant Phenomics》 SCIE 2021年第1期286-297,共12页
Reliable seed yield estimation is an indispensable step in plant breeding programs geared towards cultivar development in major row crops.The objective of this study is to develop a machine learning(ML)approach adept ... Reliable seed yield estimation is an indispensable step in plant breeding programs geared towards cultivar development in major row crops.The objective of this study is to develop a machine learning(ML)approach adept at soybean(Glycine max L.(Merr.))pod counting to enable genotype seed yield rank prediction from in-field video data collected by a ground robot.To meet this goal,we developed a multiview image-based yield estimation framework utilizing deep learning architectures.Plant images captured from different angles were fused to estimate the yield and subsequently to rank soybean genotypes for application in breeding decisions.We used data from controlled imaging environment in field,as well as from plant breeding test plots in field to demonstrate the efficacy of our framework via comparing performance with manual pod counting and yield estimation.Our results demonstrate the promise of ML models in making breeding decisions with significant reduction of time and human effort and opening new breeding method avenues to develop cultivars. 展开更多
关键词 BREEDING SOYBEAN CULTIVAR
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Interpretable deep learning for guided microstructure-property explorations in photovoltaics 被引量:2
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作者 Balaji Sesha Sarath Pokuri sambuddha ghosal +2 位作者 Apurva Kokate Soumik Sarkar Baskar Ganapathysubramanian 《npj Computational Materials》 SCIE EI CSCD 2019年第1期302-312,共11页
The microstructure determines the photovoltaic performance of a thin film organic semiconductor film.The relationship between microstructure and performance is usually highly non-linear and expensive to evaluate,thus ... The microstructure determines the photovoltaic performance of a thin film organic semiconductor film.The relationship between microstructure and performance is usually highly non-linear and expensive to evaluate,thus making microstructure optimization challenging.Here,we show a data-driven approach for mapping the microstructure to photovoltaic performance using deep convolutional neural networks.We characterize this approach in terms of two critical metrics,its generalizability(has it learnt a reasonable map?),and its intepretability(can it produce meaningful microstructure characteristics that influence its prediction?).A surrogate model that exhibits these two features of generalizability and intepretability is particularly useful for subsequent design exploration.We illustrate this by using the surrogate model for both manual exploration(that verifies known domain insight)as well as automated microstructure optimization.We envision such approaches to be widely applicable to a wide variety of microstructure-sensitive design problems. 展开更多
关键词 MICROSTRUCTURE PROPERTY meaningful
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