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Monoenergetic electron parameters in a spheroid bubble model
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作者 H.Sattarian sh.rahmatallahpur T.Tohidi 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第2期347-351,共5页
A reliable analytical expression for the potential of plasma waves with phase velocities near the speed of light is derived.The presented spheroid cavity model is more consistent than the previous spherical and ellips... A reliable analytical expression for the potential of plasma waves with phase velocities near the speed of light is derived.The presented spheroid cavity model is more consistent than the previous spherical and ellipsoidal models and it explains the mono-energetic electron trajectory more accurately,especially at the relativistic region.The maximum energy of electrons is calculated and it is shown that the maximum energy of the spheroid model is less than that of the spherical model.The electron energy spectrum is also calculated and it is found that the energy distribution ratio of electrons △E/E for the spheroid model under the conditions reported here is half that of the spherical model and it is in good agreement with the experimental value in the same conditions.As a result,the quasi-mono-energetic electron output beam interacting with the laser plasma can be more appropriately described with this model. 展开更多
关键词 quasi-mono-energetic electron bunches intense laser plasma accelerator laser wake field bubble regime
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Nanoscale potential barrier distributions and their effect on current transport in Ni/n type Si Schottky diode
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作者 M.Yeganeh N.Balkanian sh.rahmatallahpur 《Journal of Semiconductors》 EI CAS CSCD 2015年第12期74-80,共7页
We have experimentally studied the Ni/n-Si nano Schottky barrier height (SBH) and potential difference between patches in the nano Schottky diodes (SD) using contact atomic force microscopy (C-AFM) in tapping mo... We have experimentally studied the Ni/n-Si nano Schottky barrier height (SBH) and potential difference between patches in the nano Schottky diodes (SD) using contact atomic force microscopy (C-AFM) in tapping mode and scanning tunneling microscopy (STM). Topology measurement of the surface with C-AFM showed that, a single Ni/n-Si SD consists of many patches with different sizes. These patches are sets of parallel diodes and electrically interacting contacts of 5 to 50 nm sizes and between these individual diodes, there exists an additional electric field. In real metal semiconductor contacts (MSC), patches with quite different configurations, various geometrical sizes and local work functions were randomly distributed on the surface of the metal. The direction and intensity of the additional electric field are distributed in homogenously along the contact metal surface. SBH controls the electronic transport across the MS interface and therefore, is of vital importance to the successful operation of semiconductor devices. 展开更多
关键词 nano Schottky diode additional electrical field nanopatch STM and C-AFM
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