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Auger Depth Profiling of Carbonized SiC/Si Samples 被引量:2
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作者 shahzad naseem and shazia yasin(centre for solid state pliysics, university of the punjab, quaid-e-azam campus, lahore-54590, pakistan) 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 1997年第6期499-502,共4页
Silicon carbide (SiC) has been prepared by passing natural gas over (100) oriented hot Si substrate at different temperatures in the range 930~1000℃. Reaction times of 60 and 90 min are used.Depth profile, using Auge... Silicon carbide (SiC) has been prepared by passing natural gas over (100) oriented hot Si substrate at different temperatures in the range 930~1000℃. Reaction times of 60 and 90 min are used.Depth profile, using Auger Electron Spectroscopy, shows the formation of SiC under a thin coating of carbon for the samples prepared at 930 and 950℃. Annealing, at 1050℃ for 12 h,results in a more pronounced formation of SiC. It is found that at the temperature of 1000℃and reaction times of 60 and 90 min, a hard diamond-like coating is formed. 展开更多
关键词 SIC Auger Depth Profiling of Carbonized SiC/Si Samples
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