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Effects of electron radiation on commercial power MOSFET with buck converter application 被引量:1
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作者 sheik fareed ookar abubakkar Nor Farahidah Zabah +3 位作者 Yusof Abdullah Dhiyauddin Ahmad Fauzi Norasmahan Muridan Nurul Fadzlin Hasbullah 《Nuclear Science and Techniques》 SCIE CAS CSCD 2017年第3期30-34,共5页
Microelectronic power converters such as buck and boost converter are required to be tolerant to radiations including electron radiation. This paper examines electron radiation effects on the Ⅰ-Ⅴ characteristics of ... Microelectronic power converters such as buck and boost converter are required to be tolerant to radiations including electron radiation. This paper examines electron radiation effects on the Ⅰ-Ⅴ characteristics of VDMOSFET and its corresponding effects in buck converter. Analysis of the electrical characteristics shows that after irradiation the threshold voltage and drain current for all VDMOSFETs degraded more than two orders of magnitude. The impact of this electrical degradation has been investigated in an application of typical buck converter circuit. The buck converter with n-channel switching transistor shows that after irradiation its output voltage increased with the drain current in the n-channel ZVN4424 A VDMOSFET, while the buck converter with p-channel switching transistor shows its output voltage decreased with the drain current in the p-channel ZVP4424 A VDMOSFET after irradiation. 展开更多
关键词 VDMOSFET I–V characteristics DRAIN current BUCK CONVERTER ELECTRON radiation
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