Sarcomas are relatively rare malignancies;however, their huge variety and shortage of the effective therapies make this disease face huge challenge for oncology. It is recently shown that hyperthermia could be success...Sarcomas are relatively rare malignancies;however, their huge variety and shortage of the effective therapies make this disease face huge challenge for oncology. It is recently shown that hyperthermia could be successfully applied even in high-risk cases in combination with the available gold-standard regiments. Our aim is to present various advanced cases treated with a new hyperthermia method, oncothermia, showing its advantages and feasibility to successfully treat highly advanced sarcomas with curative intent.展开更多
Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its discovery.Despite the significance,the resolution of X-ray imaging has largely been limited b...Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its discovery.Despite the significance,the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens making.Various lensless imaging methods have been proposed,but are yet relying on multiple measurements or additional constraints on measurements or samples.Here we present coherent specklecorrelation imaging(CSI)using a designed X-ray diffuser.CSI has no prerequisites for samples or measurements.Instead,from a single shot measurement,the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern,ensured through a diffuser.We achieve a spatial resolution of 13.9 nm at 5.46 keV,beating the feature size of the diffuser used(300 nm).The high-resolution imaging capability is theoretically explained based on fundamental and practical limits.We expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.展开更多
Atomic movement under application of external stimuli (i.e., electric field or mechanical stress) in oxide materials has not been observed due to a lack of experimental methods but has been well known to determine t...Atomic movement under application of external stimuli (i.e., electric field or mechanical stress) in oxide materials has not been observed due to a lack of experimental methods but has been well known to determine the electric polarization. Here, we investigated atomic movement arising from the ferroelectric response of BiFeO3 thin films under the effect of an electric field and stress in real time using a combination of switching spectroscop)6 time-resolved X-ray microdiffraction, and in situ stress engineering. Under an electric field applied to a BiFeO3 film, the hysteresis loop of the reflected X-ray intensity was found to result from the opposing directions of displaced atoms between the up and down polarization states. An additional shift of atoms arising from the linearly increased dielectric component of the polarization in BiFeO3 was confirmed through gradual reduction of the diffracted X-ray intensity. The electric-field- induced displacement of oxygen atoms was found to be larger than that of Fe atom for both ferroelectric switching and increase of the polarization. The effect of external stress on the BiFeO3 thin film, which was controlled by applying an electric field to the highly piezoelectric substrate, showed smaller atomic shifts than for the case of applying an electric field to the film, despite the similar tetragonality.展开更多
文摘Sarcomas are relatively rare malignancies;however, their huge variety and shortage of the effective therapies make this disease face huge challenge for oncology. It is recently shown that hyperthermia could be successfully applied even in high-risk cases in combination with the available gold-standard regiments. Our aim is to present various advanced cases treated with a new hyperthermia method, oncothermia, showing its advantages and feasibility to successfully treat highly advanced sarcomas with curative intent.
基金supported by the Tomocube,KAIST Advanced Institute for Science-X,National Research Foundation of Korea(2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314)an Institute of Information&Communications Technology Planning&Evaluation(IITP)grant funded by the Korean government(MSIT)(2021-0-00745)+1 种基金Technology Innovation program(20011661)funded by the Ministry of Trade,Industry&Energy(MOTIE)supported in part by MSIT and POSTECH.
文摘Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its discovery.Despite the significance,the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens making.Various lensless imaging methods have been proposed,but are yet relying on multiple measurements or additional constraints on measurements or samples.Here we present coherent specklecorrelation imaging(CSI)using a designed X-ray diffuser.CSI has no prerequisites for samples or measurements.Instead,from a single shot measurement,the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern,ensured through a diffuser.We achieve a spatial resolution of 13.9 nm at 5.46 keV,beating the feature size of the diffuser used(300 nm).The high-resolution imaging capability is theoretically explained based on fundamental and practical limits.We expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.
文摘Atomic movement under application of external stimuli (i.e., electric field or mechanical stress) in oxide materials has not been observed due to a lack of experimental methods but has been well known to determine the electric polarization. Here, we investigated atomic movement arising from the ferroelectric response of BiFeO3 thin films under the effect of an electric field and stress in real time using a combination of switching spectroscop)6 time-resolved X-ray microdiffraction, and in situ stress engineering. Under an electric field applied to a BiFeO3 film, the hysteresis loop of the reflected X-ray intensity was found to result from the opposing directions of displaced atoms between the up and down polarization states. An additional shift of atoms arising from the linearly increased dielectric component of the polarization in BiFeO3 was confirmed through gradual reduction of the diffracted X-ray intensity. The electric-field- induced displacement of oxygen atoms was found to be larger than that of Fe atom for both ferroelectric switching and increase of the polarization. The effect of external stress on the BiFeO3 thin film, which was controlled by applying an electric field to the highly piezoelectric substrate, showed smaller atomic shifts than for the case of applying an electric field to the film, despite the similar tetragonality.