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Focused-Ion-Beam Induced Paramagnetic Defects in FAMn:PbI3 Perovskite Films 被引量:1
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作者 Nam Joong Jeon Jangwon Seo +4 位作者 Yanghee Kim Ji Yeong Lee sugyeong hong Sun Hee Kim Jung-Keun Lee 《Advances in Chemical Engineering and Science》 2022年第2期87-95,共9页
FAMn:PbI<sub>3</sub> perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI<sub>3</sub> with low (~1%) Mn concentration showed a hyperf... FAMn:PbI<sub>3</sub> perovskite films were synthesized and probed mainly through electron spin resonance (ESR) spectroscopy. FAMn:PbI<sub>3</sub> with low (~1%) Mn concentration showed a hyperfine sextet line originated from Mn<sup>++</sup> ions. FAMn:PbI<sub>3</sub> with high (10%) Mn concentration showed broad resonance (~500 G peak-to-peak linewidth). However, after bombardment of FAMn:PbI<sub>3</sub> with high Mn concentration by focused ion beams (FIB), a sharp ESR peak appeared. The peak-to-peak linewidth (ΔH<sub>pp</sub>) was ~8 G regardless of the temperature. The FIB-induced defect showed Curie behavior at low temperatures (5 K - 50 K), which indicates the presence of localized electrons at the defect sites at low temperatures. The g-value increased from g = 2.0002 to 2.0016 as the temperature increased from 5 K to 50 K. Together with the ongoing search for electron spin echo (ESE), this could potentially provide a platform for realizing magnetic bits, information storage, and increased manipulation speed. 展开更多
关键词 Perovskite Manganites FIB Paramagnetic Spins
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