Both grain yield and disease performance are important factors to consider for winter wheat （Triticum aestivum） cultivar selection. However, disease index and yield data are often presented separately, making it dif...Both grain yield and disease performance are important factors to consider for winter wheat （Triticum aestivum） cultivar selection. However, disease index and yield data are often presented separately, making it difficult to compare values across multiple environments. Two-year investigations （2009-2010）, in which eight common wheat lines/genotypes were included to test their susceptibility against wheat LR （leaf rust） Puccinia triticina f. sp. tritici Roberge ex Desm., and the SLB （SeptoriaJStagonospora leaf blotch） complex Septoria tritici Desm. and Stagonospora nodorum, were carried out in the experimental field of ATTC （Agriculture Technology Transfer Centre） of Lushnje （Albania）. The objective of this study was to use a rank-based method to compare cultivars based on yield and disease performance combined across multiple environments. Analysis of variance revealed the presence of an important and significant variability in the experimental materials used to evaluate the susceptibility and the resistance of common wheat lines against SLB and LR. There were high negative correlations between yieldS, tritici （0.6683） and yield--P, recondita f. sp. tritici （0.5261）. The negative effects of two pathogens have shown ＂the parallel＂/similar negative influences on yield trait and there was a high positive correlation （0.7631） between S. tritici and P. recondita f. sp. tritici. According to study results the lines Regina × L-776, IKB-P6 and Bullgar 3 × KB 703 have shown good results of resistance （R） level against S. tritici and P. recondita f. sp. tritici.展开更多
文摘Both grain yield and disease performance are important factors to consider for winter wheat （Triticum aestivum） cultivar selection. However, disease index and yield data are often presented separately, making it difficult to compare values across multiple environments. Two-year investigations （2009-2010）, in which eight common wheat lines/genotypes were included to test their susceptibility against wheat LR （leaf rust） Puccinia triticina f. sp. tritici Roberge ex Desm., and the SLB （SeptoriaJStagonospora leaf blotch） complex Septoria tritici Desm. and Stagonospora nodorum, were carried out in the experimental field of ATTC （Agriculture Technology Transfer Centre） of Lushnje （Albania）. The objective of this study was to use a rank-based method to compare cultivars based on yield and disease performance combined across multiple environments. Analysis of variance revealed the presence of an important and significant variability in the experimental materials used to evaluate the susceptibility and the resistance of common wheat lines against SLB and LR. There were high negative correlations between yieldS, tritici （0.6683） and yield--P, recondita f. sp. tritici （0.5261）. The negative effects of two pathogens have shown ＂the parallel＂/similar negative influences on yield trait and there was a high positive correlation （0.7631） between S. tritici and P. recondita f. sp. tritici. According to study results the lines Regina × L-776, IKB-P6 and Bullgar 3 × KB 703 have shown good results of resistance （R） level against S. tritici and P. recondita f. sp. tritici.
