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Detection of Graphene Cracks By Electromagnetic Induction,Insensitive to Doping Level
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作者 Taeshik Yoon sumin kang +1 位作者 Tae Yeob kang Taek-Soo Kim 《Computer Modeling in Engineering & Sciences》 SCIE EI 2019年第8期351-361,共11页
Detection of cracks is a great concern in production and operation processes of graphene based devices to ensure uniform quality.Here,we show a detection method for graphene cracks by electromagnetic induction.The tim... Detection of cracks is a great concern in production and operation processes of graphene based devices to ensure uniform quality.Here,we show a detection method for graphene cracks by electromagnetic induction.The time varying magnetic field leads to induced voltage signals on graphene,and the signals are detected by a voltmeter.The measured level of induced voltage is correlated with the number of cracks in graphene positively.The correlation is attributed to the increasing inductive characteristic of defective graphene,and it is verified by electromagnetic simulation and radio frequency analysis.Furthermore,we demonstrate that the induced voltage signal is insensitive to the doping level of graphene.Our work can potentially lead to the development of a high-throughput and reliable crack inspection technique for mass production of graphene applications. 展开更多
关键词 Graphene crack DETECTION INDUCTANCE electromagnetic INDUCTION insensitive to DOPING
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