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Te-free SbBi thin film as a laser heat-mode photoresist 被引量:1
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作者 张奎 王正伟 +5 位作者 陈国东 王阳 曾爱军 朱菁 syarhei avakaw Heorgi Tsikhanchuk 《Chinese Optics Letters》 SCIE EI CAS CSCD 2019年第9期105-108,共4页
A Te-free binary phase change material Sb Bi is proposed as a new inorganic photoresist for heat-mode lithography. It shows good film-forming ability(surface roughness <1 nm), low threshold power for crystallizatio... A Te-free binary phase change material Sb Bi is proposed as a new inorganic photoresist for heat-mode lithography. It shows good film-forming ability(surface roughness <1 nm), low threshold power for crystallization(2 m W), and high etching selectivity(15:1). Line-type, dot-type, and complex pattern structures with the smallest feature size of 275 nm are fabricated on Sb Bi thin films using a 405 nm diode laser direct writing system. In addition, the excellent grating structures with a period of 0.8 μm demonstrate that thermal interference does not affect the adjacent microstructures obviously. These results indicate that Sb Bi is a promising laser heat-mode resist material for micro/nanostructure fabrication. 展开更多
关键词 Te-free SbBi LASER heat-mode PHOTORESIST
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