针对目前汽车装配监视生产线仍需人工作业、工作步骤繁琐以及效率不高的情况,设计了基于西门子S7-1200 PLC和西克射频识别(Radio Frequency Identification,RFID)技术的装配监视追溯系统。详细介绍了该系统的基本结构,系统实现了生产现...针对目前汽车装配监视生产线仍需人工作业、工作步骤繁琐以及效率不高的情况,设计了基于西门子S7-1200 PLC和西克射频识别(Radio Frequency Identification,RFID)技术的装配监视追溯系统。详细介绍了该系统的基本结构,系统实现了生产现场自动采集和写入仪表信息,上位机集中监视现场装配状况,同时将数据库中的仪表信息接入汽车厂制造企业生产过程执行管理系统(Manufacturing Process Execution Management System,MES),为汽车零/部件追溯和故障召回提供数据支持。该系统已在长春某汽车厂正式投入使用6个月,实践应用表明,该系统提高了工作效率,运行平稳,采集仪表底盘号成功率在99%以上,取得了良好的预期效果。展开更多
Depth profiles of fluorine in ^(19)F^(+) implanted Ni_(0.8)Fe_(0.2) alloy have been accurately measured by using ^(19)F(p,αγ)^(16)O resonance nuclear reaction at ER=872.1keV.A proper convolution calculation method w...Depth profiles of fluorine in ^(19)F^(+) implanted Ni_(0.8)Fe_(0.2) alloy have been accurately measured by using ^(19)F(p,αγ)^(16)O resonance nuclear reaction at ER=872.1keV.A proper convolution calculation method was used to extract the true distribution of fluorine from the experimental excitation yield curves.The range parameters,R,and ΔR_(p),were thereby obtained and compared with those simulated wit TRIM'90 code.It shows that the experimental R_(p) values agree with the Monte Carlo simulation values very well,while the experimental ΔR_(p) values are systematically larger than the calculation values.展开更多
Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of i...Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of impulse-coupling is proposed,which significantly improves the agreement between the calculated impulse-coupling coefficient and the measured one.展开更多
Surface relaxation and lattice dynamics of(100)Si have been studied using Tersoff-Dodson type Si potential.The average temperature of the lattice is studied as well.The temperature fluctuates with a frequency of 9.5&#...Surface relaxation and lattice dynamics of(100)Si have been studied using Tersoff-Dodson type Si potential.The average temperature of the lattice is studied as well.The temperature fluctuates with a frequency of 9.5×10^(12) Hz,,that is about the average frequency of the optical phonons in Si.The(100)Si surface relaxes inward by 0.86Å,and a reduction of 19%in the first interlayer spacing is found.展开更多
Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 ke...Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 keV.A proper convolution method was used to get the real depth profiles of fluorine from the measured y-ray excitation curves.Secondary ion mass spectrometry in conjunction with Rutherford backscattering spectrometry analysis was used to determine the density of the FTO films.It was found that the density of the films is markedly different from an earlier reported value.展开更多
The depth profile of Br in ^(79)Br^(+) ion implanted lead-tin-telluride,Pb_(1-x)Sn_(x),was obtained by secondary ion mass spectrometry(SIMS).The SIMS profile has been compared with that obtained by our theoretical cal...The depth profile of Br in ^(79)Br^(+) ion implanted lead-tin-telluride,Pb_(1-x)Sn_(x),was obtained by secondary ion mass spectrometry(SIMS).The SIMS profile has been compared with that obtained by our theoretical calculation,in which a more realistic interatomic potential and reasonable electronic stopping power were used.The SIMS result agrees well with the theoretical calculation.展开更多
文摘针对目前汽车装配监视生产线仍需人工作业、工作步骤繁琐以及效率不高的情况,设计了基于西门子S7-1200 PLC和西克射频识别(Radio Frequency Identification,RFID)技术的装配监视追溯系统。详细介绍了该系统的基本结构,系统实现了生产现场自动采集和写入仪表信息,上位机集中监视现场装配状况,同时将数据库中的仪表信息接入汽车厂制造企业生产过程执行管理系统(Manufacturing Process Execution Management System,MES),为汽车零/部件追溯和故障召回提供数据支持。该系统已在长春某汽车厂正式投入使用6个月,实践应用表明,该系统提高了工作效率,运行平稳,采集仪表底盘号成功率在99%以上,取得了良好的预期效果。
文摘Depth profiles of fluorine in ^(19)F^(+) implanted Ni_(0.8)Fe_(0.2) alloy have been accurately measured by using ^(19)F(p,αγ)^(16)O resonance nuclear reaction at ER=872.1keV.A proper convolution calculation method was used to extract the true distribution of fluorine from the experimental excitation yield curves.The range parameters,R,and ΔR_(p),were thereby obtained and compared with those simulated wit TRIM'90 code.It shows that the experimental R_(p) values agree with the Monte Carlo simulation values very well,while the experimental ΔR_(p) values are systematically larger than the calculation values.
文摘Impulse-copling coefficients,for A1 and Cu samples with finite surface area irradiated in air by 1.06μm,10ns laser pulses produced by a Nd:YAG laser,have been measured experimentally.A modified theoretical model of impulse-coupling is proposed,which significantly improves the agreement between the calculated impulse-coupling coefficient and the measured one.
基金Supported by the National Natural Science Foundation of Cliina.
文摘Surface relaxation and lattice dynamics of(100)Si have been studied using Tersoff-Dodson type Si potential.The average temperature of the lattice is studied as well.The temperature fluctuates with a frequency of 9.5×10^(12) Hz,,that is about the average frequency of the optical phonons in Si.The(100)Si surface relaxes inward by 0.86Å,and a reduction of 19%in the first interlayer spacing is found.
文摘Depth profiles of fluorine in F-doped tin oxide(FTO)films prepared by atmospherical pressure chemical vapour deposition method have been studied by use of ^(19)F(p,αγ)^(16)O resonance nuclear reactions near 872.1 keV.A proper convolution method was used to get the real depth profiles of fluorine from the measured y-ray excitation curves.Secondary ion mass spectrometry in conjunction with Rutherford backscattering spectrometry analysis was used to determine the density of the FTO films.It was found that the density of the films is markedly different from an earlier reported value.
基金Projects supported by the Science Fund of the Chinese Academy of Sciences。
文摘The depth profile of Br in ^(79)Br^(+) ion implanted lead-tin-telluride,Pb_(1-x)Sn_(x),was obtained by secondary ion mass spectrometry(SIMS).The SIMS profile has been compared with that obtained by our theoretical calculation,in which a more realistic interatomic potential and reasonable electronic stopping power were used.The SIMS result agrees well with the theoretical calculation.
