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DC Characteristics of Gamma-ray Irradiated SiGe HBT in Comparison with Si BJT
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作者 MENG Xiang-ti HUANG Qian +2 位作者 WANG Ji lin CHEN Pei-yi tsien pei-hsin 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 2006年第B12期192-197,共6页
The changes of DC characteristics of SiGe HBT after being submitted to γ-ray irradiation of 700 krad, 7 000 krad and 10 000 krad were compared to those of Si BJT. Generally speaking, Ib and Ib- Ib0 increase with the ... The changes of DC characteristics of SiGe HBT after being submitted to γ-ray irradiation of 700 krad, 7 000 krad and 10 000 krad were compared to those of Si BJT. Generally speaking, Ib and Ib- Ib0 increase with the doses increasing. For SiGe HBT, with the doses increasing, Ic and Ic-Ic0 as well as the related changes of the current gain (β) will decrease at higher Vbe, while for Si BJT, with the doses increasing, after irradiation, Ib and Ic-Ic0 increase; ,8 and its related changes also decrease with their differences, however, tending to be very small at high doses of 7 000 krad and 10 000 krad. Moreover, given the same doses, the decreases of,a are much larger than SiGe HBT, which shows that SiGe HBT's anti-radiation performance proves to be better than Si BJT. Still, in SiGe HBT, some strange phenomena were observed: Ic-Ic0 will increase after the radiation of 7 000 krad in less than 0.65 V and as will ,8 in less than 0.75 V. The mechanism of radiation-induced change in DC characteristies was also discussed. 展开更多
关键词 γ-ray irradiation SiGe HBT Si BJT DC characteristics
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