We demonstrate a novel flat-field,dual-optic imaging EUV—soft X-ray spectrometer and monochromator that attains an unprecedented throughput efficiency exceeding 60%by design,along with a superb spectral resolution of...We demonstrate a novel flat-field,dual-optic imaging EUV—soft X-ray spectrometer and monochromator that attains an unprecedented throughput efficiency exceeding 60%by design,along with a superb spectral resolution ofλ/Δλ>200 accomplished without employing variable line spacing gratings.Exploiting the benefits of the conical diffraction geometry,the optical system is globally optimized in multidimensional parameter space to guarantee optimal imaging performance over a broad spectral range while maintaining circular and elliptical polarization states at the first,second,and third diffraction orders.Moreover,our analysis indicates minimal temporal dispersion,with pulse broadening confined within 80 fs tail-to-tail and an FWHM value of 29 fs,which enables ultrafast spectroscopic and pump-probe studies with femtosecond accuracy.Furthermore,the spectrometer can be effortlessly transformed into a monochromator spanning the EUV—soft X-ray spectral region using a single grating with an aberration-free spatial profile.Such capability allows coherent diffractive imaging applications to be conducted with highly monochromatic light in a broad spectral range and extended to the soft X-ray region with minimal photon loss,thus facilitating state-of-the-art imaging of intricate nano-and bio-systems,with a significantly enhanced spatiotemporal resolution,down to the nanometer–femtosecond level.展开更多
基金funding from the National Key Research and Development Program of China(2021YFB3602600)the Chinese Academy of Sciences(CAS)(GJJSTD20200009)(2018-131-S)+3 种基金the National Natural Science Foundation of China(NSFC)(62121003)(10010108B1339-2451)the Beijing Municipal Science&Technology Commission(Z221100006722008)T.P.gratefully acknowledges funding from the European Research Council(ERC)(grant agreement XSTREAM-716950)the Alfred P.Sloan Foundation(FG-2018-10892)。
文摘We demonstrate a novel flat-field,dual-optic imaging EUV—soft X-ray spectrometer and monochromator that attains an unprecedented throughput efficiency exceeding 60%by design,along with a superb spectral resolution ofλ/Δλ>200 accomplished without employing variable line spacing gratings.Exploiting the benefits of the conical diffraction geometry,the optical system is globally optimized in multidimensional parameter space to guarantee optimal imaging performance over a broad spectral range while maintaining circular and elliptical polarization states at the first,second,and third diffraction orders.Moreover,our analysis indicates minimal temporal dispersion,with pulse broadening confined within 80 fs tail-to-tail and an FWHM value of 29 fs,which enables ultrafast spectroscopic and pump-probe studies with femtosecond accuracy.Furthermore,the spectrometer can be effortlessly transformed into a monochromator spanning the EUV—soft X-ray spectral region using a single grating with an aberration-free spatial profile.Such capability allows coherent diffractive imaging applications to be conducted with highly monochromatic light in a broad spectral range and extended to the soft X-ray region with minimal photon loss,thus facilitating state-of-the-art imaging of intricate nano-and bio-systems,with a significantly enhanced spatiotemporal resolution,down to the nanometer–femtosecond level.
