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Scanning-Position Error-Correction Algorithm in Dual-Wavelength Ptychographic Microscopy
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作者 Rui Ma Shu-Yuan Zhang +3 位作者 tian-hao ruan Ye Tao Hua-Ying Wang Yi-Shi Shi 《Chinese Physics Letters》 SCIE CAS CSCD 2020年第4期41-45,共5页
We propose a new algorithm for the error correction of scanning positions in ptychographic microscopy.Since the scanning positions are varied mechanically by moving the illuminating probes laterally,the scanning error... We propose a new algorithm for the error correction of scanning positions in ptychographic microscopy.Since the scanning positions are varied mechanically by moving the illuminating probes laterally,the scanning errors will accumulate at multiple positions,greatly reducing the reconstruction quality of a sample.To correct the scanning errors,we use the correlation analysis for the diffractive data combining with the additional constraint of dual wavelengths.This significantly improves the quality of ptychographic microscopy.Optical experiments verify the proposed algorithm for two samples including a resolution target and a fibroblast. 展开更多
关键词 Dual POSITIONS CORRECTION
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