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Interfacial dynamics of GaP/Si(100) heterostructure grown by molecular beam epitaxy
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作者 tieshi wei Xuefei Li +4 位作者 Zhiyun Li Wenxian Yang Yuanyuan Wu Zhiwei Xing Shulong Lu 《Journal of Semiconductors》 EI CAS CSCD 2022年第12期32-38,共7页
The atomic structure and surface chemistry of GaP/Si(100)heterostructure with different pre-layers grown by molecu-lar beam epitaxy are studied.It is found that GaP epilayer with Ga-riched pre-layers on Si(100)substra... The atomic structure and surface chemistry of GaP/Si(100)heterostructure with different pre-layers grown by molecu-lar beam epitaxy are studied.It is found that GaP epilayer with Ga-riched pre-layers on Si(100)substrate has regular surface mor-phology and stoichiometric abrupt heterointerfaces from atomic force microscopes(AFMs)and spherical aberration-corrected transmission electron microscopes(ACTEMs).The interfacial dynamics of GaP/Si(100)heterostructure is investigated by X-ray photoelectron spectroscopy(XPS)equipped with an Ar gas cluster ion beam,indicating that Ga pre-layers can lower the inter-face formation energy and the bond that is formed is more stable.These results suggest that Ga-riched pre-layers are more con-ducive to the GaP nucleation as well as the epitaxial growth of GaP material on Si(100)substrate. 展开更多
关键词 XPS interfacial dynamics GaP/Si(100)heterostructure MBE
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