期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes 被引量:4
1
作者 Jan Ruschel Johannes Glaab +7 位作者 Batoul Beidoun Neysha Lobo Ploch Jens Rass tim kolbe Arne Knauer Markus Weyers Sven Einfeldt Michael Kneissl 《Photonics Research》 SCIE EI CSCD 2019年第7期14-18,共5页
The impact of operation current on the degradation behavior of 310 nm UV LEDs is investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current densities from 34 to 201 A/cm^2.To separate t... The impact of operation current on the degradation behavior of 310 nm UV LEDs is investigated over 1000 h of stress. It ranges from 50 to 300 mA and corresponds to current densities from 34 to 201 A/cm^2.To separate the impact of current from that of temperature, the junction temperature is kept constant by adjusting the heat sink temperature. Higher current was found to strongly accelerate the optical power reduction during operation. A mathematical model for lifetime prediction is introduced.It indicates that lifetime is inversely proportional to the cube of the current density, suggesting the involvement of Auger recombinati on. 展开更多
关键词 DEGRADATION LIGHT-EMITTING DIODES LIFETIME
原文传递
上一页 1 下一页 到第
使用帮助 返回顶部