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Research Activities of Nanodimensional Standards Using Atomic Force Microscopes,Transmission Electron Microscope,and Scanning Electron Microscope at the National Metrology Institute of Japan 被引量:2
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作者 Ichiko Misumi Ryosuke Kizu +3 位作者 Hiroshi Itoh Kazuhiro Kumagai Keita Kobayashi tomoo sigehuzi 《Nanomanufacturing and Metrology》 EI 2022年第2期83-90,共8页
With the progress in nanotechnology,the importance of nanodimensional standards is increasing.Realizing nanodimensional standards requires multiple types of high-precision microscopy techniques.The National Metrology ... With the progress in nanotechnology,the importance of nanodimensional standards is increasing.Realizing nanodimensional standards requires multiple types of high-precision microscopy techniques.The National Metrology Institute of Japan(NMIJ),one of the research domains in the National Institute of Advanced Industrial Science and Technology(AIST),is developing nanodimensional standards using atomic force,transmission electron,and scanning electron microscopes.The current status of nanodimensional standards in NMIJ is introduced herein. 展开更多
关键词 Nanodimensional standards Calibration Uncertainty AFM TEM SEM
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