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Effect of Different Etching Time on Fabrication of an Optoelectronic Device Based on GaN/Psi
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作者 Haneen D.Jabbar Makram A.Fakhri +4 位作者 Mohammed Jalal Abdul Razzaq Omar S.Dahham Evan T.Salim Forat H.Alsultany u.hashim 《Journal of Renewable Materials》 SCIE EI 2023年第3期1101-1122,共22页
Gallium nitride(GaN)/porous silicon(PSi)film was prepared using a pulsed laser deposition method and 1064 nm Nd:YAG laser for optoelectronic applications and a series of Psi substrates were fabricated using a photoele... Gallium nitride(GaN)/porous silicon(PSi)film was prepared using a pulsed laser deposition method and 1064 nm Nd:YAG laser for optoelectronic applications and a series of Psi substrates were fabricated using a photoelectrochemical etching method assisted by laser at different etching times for 2.5–15 min at 2.5 min intervals.X-ray diffraction,room-temperature photoluminescence,atomic force microscopy and field emission scanning electron microscopy images,and electrical characteristics in the prepared GaN on the Psi film were investigated.The optimum Psi substrate was obtained under the following conditions:10 min,10 mA/cm^(2),and 24%hydrofluoric acid.The substrate exhibited two highly cubic crystalline structures at(200)and(400)orientations and yellow visible band photoluminescence,and homogeneous pores formed over the entire surface.The pores had steep oval shapes and were accompanied by small dark pores that appeared topographically and morphologically.The GaN/Psi film fabricated through PLD exhibited a high and hexagonal crystallographic texture in the(002)plane.Spectroscopic properties results revealed that the photoluminescence emission of the deposited nano-GaN films was in the ultraviolet band(374 nm)related to GaN material and in the near-infrared band(730 nm)related to the Psi substrate.The topographical and morphological results of the GaN films confirmed that the deposited film contained spherical grains with an average diameter of 51.8 nm and surface roughness of 4.8 nm.The GaN/Psi surface showed a cauliflower-like morphology,and the built-in voltage decreased from 3.4 to 2.7 eV after deposition.The fabricated GaN/Psi film exhibited good electrical characteristics. 展开更多
关键词 Gallium nitride porous silicon photoelectrochemical etching pulsed laser deposition optical device
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Silicon nanowire formed via shallow anisotropic etching Si-ash-trimming for specific DNA and electrochemical detection
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作者 Tijjani Adam u.hashim Th S.Dhahi 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第6期607-612,共6页
A functionalized silicon nanowire field-effect transistor (SiNW FET) was fabricated to detect single molecules in the pM range to detect disease at the early stage with a sensitive, robust, and inexpensive method wi... A functionalized silicon nanowire field-effect transistor (SiNW FET) was fabricated to detect single molecules in the pM range to detect disease at the early stage with a sensitive, robust, and inexpensive method with the ability to provide specific and reliable data. The device was designed and fabricated by indented ash trimming via shallow anisotropic etching. The approach is a simple and low-cost technique that is compatible with the current commercial semiconductor standard CMOS process without an expensive deep reactive ion etcher. Specific electric changes were observed for DNA sensing when the nanowire surface was modified with a complementary captured DNA probe and target DNA through an organic linker (--OCH2CH3) using organofunctional alkoxysilanes (3-aminopropyl) triethoxysilane (APTES). With this surface modification, a single specific target molecule can be detected. The simplicity of the sensing domain makes it feasible to miniaturize it for the development of a cancer detection kit, facilitating its use in both clinical and non-clinical environments to allow non-expert interpretation. With its novel electric response and potential for mass commercial fabrication, this biosensor can be developed to become a portable/point of care biosensor for both field and diagnostic applications. 展开更多
关键词 silicon nanowire BIOSENSOR specific DNA detection anisotropic etching Si-ash-trimming semi-conductor pH sensor
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Graphene synthesis,fabrication,characterization based on bottom-up and top-down approaches:An overview
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作者 Agbolade Lukman Olatomiwa Tijjani Adam +3 位作者 Subash C.B.Gopinath Sanusi Yekinni Kolawole Oyeshola Hakeem Olayinka u.hashim 《Journal of Semiconductors》 EI CAS CSCD 2022年第6期8-22,共15页
This study presents an overview on graphene synthesis,fabrication and different characterization techniques utilized in the production.Since its discovery in 2004 by Andre Geim and Kostya Novoselov several research ar... This study presents an overview on graphene synthesis,fabrication and different characterization techniques utilized in the production.Since its discovery in 2004 by Andre Geim and Kostya Novoselov several research articles have been published globally to this effect,owing to graphene’s extraordinary,and exclusive characteristics which include optical transparency,excellent thermal,and mechanical properties.The properties and applications of this two-dimensional carbon crystal composed of single-layered material have created new avenues for the development of high-performance future electronics and technologies in energy storage and conversion for the sustainable energy.However,despite its potential and current status globally the difficulty in the production of monolayer graphene sheet still persists.Therefore,this review highlighted two approaches in the synthesis of graphene,which are the top-down and bottom-up approaches and examined the advantages and failings of the methods involved.In addition,the prospects and failings of these methods are investigated,as they are essential in optimizing the production method of graphene vital for expanding the yield,and producing high-quality graphene. 展开更多
关键词 two-dimensional material NANOMATERIAL carbon material NANOSTRUCTURE
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