期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
Wireless Preamplifier for the Specimen Current Mode Detector in a SEM
1
作者 valentin g. dyukov 《Optics and Photonics Journal》 2024年第2期23-28,共6页
Using a scanning electron microscope (SEM) in the back-scattered electron (BSE) mode the composition of multi-element specimens may be determined based on the strong dependence of emission coefficient η on the averag... Using a scanning electron microscope (SEM) in the back-scattered electron (BSE) mode the composition of multi-element specimens may be determined based on the strong dependence of emission coefficient η on the average atomic number of elements Z. The output video signal of the usual BSE detectors is produced from their sensors, and the larger proportion of high-energy electrons with modified spectrum is added. Since η = is/ip (is and ip currents of specimen and probe), better accuracy must be achieved by direct measurements those currents on the specimen surface. Here, an experimental model of a current detector for a presented specimen is described. The cage is mounted on the carousel of the moving specimen stage. The input of the preamplifier is connected to the specimen holder in the form of a disk, the diameter of which is 12 mm. When the probe along its surface scanned, the input potential begins to pulsate with a negative polarity. The output of this preamplifier is connected to a small light-emitting diode, which creates intensity-modulated radiation in the chamber. Thus created the light video signal will be picked up by the photomultiplier of the E-T detector. The modes of true SE and BSE are set by applying tens bias volts of various polarities to the specimens or the cage itself. 展开更多
关键词 Scanning Electron Microscopy Backscattered Electron Imaging Wireless Specimen Current Preamplifier Universal (SE/BSE) Dyukov Detector
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部