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Refractive index measurement of dielectric samples using highly focused radially polarized light(Invited Paper)
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作者 Guadalupe López-Morales victor-manuel rico-botero +1 位作者 Rafael Espinosa-Luna Qiwen Zhan 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第3期12-15,共4页
In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical ape... In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA) objective lens reflected by the sample under study, the Brewster angle is found. Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot. The refractive index of the sample is estimated using the measured Brewster angle. The experimental results are compared with the theoretical images computed with the Fresnel theory, and a good agreement is obtained. 展开更多
关键词 high Refractive index measurement of dielectric samples using highly focused radially polarized light
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