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Tuning the morphologies of SiC nanowires via the change of the Co_xSi_y melts 被引量:2
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作者 J.J.Chen Y.Pan +1 位作者 w.h.tang Q.Shi 《Nano-Micro Letters》 SCIE EI CAS 2010年第1期11-17,共7页
SiC nanowires and SiC/SiO2 core-shell structural nanowires were synthesized via a simple thermal evaporation of CoxSiy melts at the temperature of 1500?C. The morphologies and yields of those SiC nanowires can be tune... SiC nanowires and SiC/SiO2 core-shell structural nanowires were synthesized via a simple thermal evaporation of CoxSiy melts at the temperature of 1500?C. The morphologies and yields of those SiC nanowires can be tuned by altering the composition of CoxSiy. Nanowires obtained by thermal evaporation of Co Si are composed of SiC/SiO2 core-shell nanostructures with lengths up to several hundreds of micrometers, diameters of 4050 nm, and the thickness of amorphous SiO2 wrapping shell about 20 nm. SiC nanowires prepared by thermal evaporation of Co Si2 and Co2 Si melt are found to be hexagonal-prism-shaped nanorods, and the diameter of those nanorods is about 150 nm and the length is about 10 microns. All the SiC nanowires obtained possess [111] preferred growth direction with a high density stacking faults and twin defects. Taking into consideration the binary alloy diagram of Co Si and the participation of oxygen, we propose the vapor-solid growth mechanism of SiC nanowires and discuss the effect of the supersaturation of Si O on the morphology and yields of SiC nanowires. 展开更多
关键词 Silicon carbide NANOWIRES MORPHOLOGY
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Micro—structural analysis of YBa2Cu3O7—x thin films grown on different substrates by X—ray techniques
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作者 C.X.Liu M.Xu +6 位作者 w.h.tang X.M.Chen L.S.Wu N.Yang Z.H.Mai K.Tao J.G 《Beijing Synchrotron Radiation Facility》 2001年第2期54-60,共7页
YBa2Cu3Ox(YBCO) thin films grown on different substrates with and/or without Eu2CuO4(ECO) buffer layer were investigated by X-ray wide angle diffraction,reflection,diffuse scattering and topography.Theresults show tha... YBa2Cu3Ox(YBCO) thin films grown on different substrates with and/or without Eu2CuO4(ECO) buffer layer were investigated by X-ray wide angle diffraction,reflection,diffuse scattering and topography.Theresults show that for the yttria stabilized ZrO2(YSZ) substrate,the presence of an ECO buffer layer improves the crystalline quality of the YBCO film,while a negative effect is observed for the SrTiO3(STO) substrate.The lateral correlation length for a sample grown on a YSZ substrate with ECO buffer Layer is much greater than grown on an STO subetrate.The STO substrate used has mosaic structure.2001 Elsevier Science B.V.All rights reserved. 展开更多
关键词 微观结构 X射线衍射分析 YBa2Cu3O7薄膜 钇钡铜复合氧化物薄膜 缓冲层 薄膜生长
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