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Outgassing analysis of molecular glass photoresists under EUV irradiation 被引量:4
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作者 CHEN Li XU Jian +10 位作者 YUAN Hua YANG Shu Min wang Lian Sheng WU Yan qing ZHAO Jun CHEN Ming LIU Hai Gang LI Sha Yu TAI Ren Zhong wang shuang qing YANG Guo Qiang 《Science China Chemistry》 SCIE EI CAS 2014年第12期1746-1750,共5页
A device was designed and assembled to analyze the outgassing of molecular glass(MG)photoresists under extreme ultraviolet(EUV)exposure.The outgassing of the photoresists with different components and different concen... A device was designed and assembled to analyze the outgassing of molecular glass(MG)photoresists under extreme ultraviolet(EUV)exposure.The outgassing of the photoresists with different components and different concentrations of tert-butoxycarbonyl(t-Boc),photo-generated acid(PAG),and acid quencher was systematically investigated.Based on experiments,some solutions for reducing the outgassing of MG photoresists were proposed. 展开更多
关键词 PHOTORESIST EUV lithography molecular glass OUTGASSING
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