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STUDIES OF ALL-NIOBIUM ELECTRODE JOSEPHSON TUNNEL JUNCTIONS WITH AMORPHOPUS SILICON BARRIERS
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作者 MENG Xiaofan wang xiewen 《Chinese Physics Letters》 SCIE CAS 1987年第8期369-372,共4页
This paper reports the fabrication and properties of small Nb-(a-Si)-Nb-(a-Si)-Nb Josephson tunnel junctions.The smallest junction area is about 0.3μm^(2).A thin a-Si film deposited by electron beam evaporation was o... This paper reports the fabrication and properties of small Nb-(a-Si)-Nb-(a-Si)-Nb Josephson tunnel junctions.The smallest junction area is about 0.3μm^(2).A thin a-Si film deposited by electron beam evaporation was oxidized and used for the tunnel barriers.TEM and XPS investigations indicate that the barrier layers consist of SiOx and Si.The junctions have been used for RF SQUID with an energy resolution of 1.9×l0^(-28) J/Hz. 展开更多
关键词 smallest SQUID BARRIER
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