The increase of absorption loss in photosensitivity enhanced optical fiber via H_(2) loading induced in the making process of fiber grating was measured.From the results it can be seen that hydroxyl induced by exposin...The increase of absorption loss in photosensitivity enhanced optical fiber via H_(2) loading induced in the making process of fiber grating was measured.From the results it can be seen that hydroxyl induced by exposing the H_(2) loaded GeO_(2)-doped optical fiber to 248nm light causes large absorption loss at 1.4μm.A reaction model is postulated to describe the process that leads to the loss increase and photosensitivity enhancement in GeO_(2)-doped optical fiber.展开更多
The zero-order diffraction of phase grating mask is analysed for rectangular and sinusoidal corrugated profiles,and a novel method is proposed for determining the depth and duty cycle parameter by the diffraction meas...The zero-order diffraction of phase grating mask is analysed for rectangular and sinusoidal corrugated profiles,and a novel method is proposed for determining the depth and duty cycle parameter by the diffraction measurement at different wavelengths.展开更多
基金Supported by the National Natural Science Foundation of China under Grant No.69377012.
文摘The increase of absorption loss in photosensitivity enhanced optical fiber via H_(2) loading induced in the making process of fiber grating was measured.From the results it can be seen that hydroxyl induced by exposing the H_(2) loaded GeO_(2)-doped optical fiber to 248nm light causes large absorption loss at 1.4μm.A reaction model is postulated to describe the process that leads to the loss increase and photosensitivity enhancement in GeO_(2)-doped optical fiber.
基金Supported by the National Natural Science Foundation of China under Grant No.69377012in part by the Research Grant Council of Hong Kong,the Croucher Foundation.
文摘The zero-order diffraction of phase grating mask is analysed for rectangular and sinusoidal corrugated profiles,and a novel method is proposed for determining the depth and duty cycle parameter by the diffraction measurement at different wavelengths.
